Atomic force microscope (lab manual – Worcester Polytech – Nancy Burnham)
Preparing DNA or nanotube AFM samples (lab manual – Amherst – Ashley Carter)
Journal papers
Donner, B., M. Kleber, C. Bracher, and H. J. Kreuzer (2005), "A simple method for simulating scanning tunneling images," Am. J. Phys. 73 (8), 690-700.
Lewis, R. A., S. A. Gower, P. Groombridge, D. T. W. Cox, and L. G. Adorni-Braccesi (1991), "Student scanning tunneling microscope," Am. J. Phys. 59, 38-42.
Williams, P. J., D. White, K. Mossman, S. Walker, and G. P. Cant (1997), "A simple scanning tunneling microscope," Am. J. Phys. 65 (2), 160-1.
Curson, N. J., R. J. Wilson, L. A. Silva, W. Allison, and G. A. C. Jones (1999), "Studying the kinetics of graphite oxidation using a scanning tunnelling microscope-an undergraduate laboratory experiment," Eur. J. Phys. 20(6), 453-60.
Rebello, N. S., K. Sushenko, and D. A. Zollman (1997), "Learning the physics of a scanning tunnelling microscope using a computer program," Eur. J. Phys. 18 (6), 456-61.
Moreland, J. (1986), "Squeezable junctions for electron tunnelling and surface electric field experiment," Phys. Teach. 24 (7), 405-11.
Anguiano, E., A. I. Oliva, and M. Aguilar (1998), "Optimal conditions for imaging in scanning tunneling microscopy: Theory," Rev. Sci. Instrum. 69, 3867-3874.
Anguiano, E., A. I. Oliva, and M. Aguilar (1998), "Optimal conditions for imaging in scanning tunneling microscopy: Experimental," Rev. Sci. Instrum. 69, 3875-3878.
Fotino, M. (1993), "Tip sharpening by normal and reverse electrochemical etching," Rev. Sci. Instrum. 64, 159-167.
Murphy, W. L. and G. C. Spalding (1999), "Range of interactions: An experiment in atomic and magnetic force microscopy," Am. J. Phys. 67 (10), 905-8.
Devenica, L. M., C. Contee, R. Cabrejo, M. Kurek, E. F. Deveney, and A. R. Carter (2016), "Biophysical measurements of cells, microtubules, and DNA with an atomic force microscope," Am. J. Phys. 84 (4), 301 - 10.
Li, Y., L. Zhang, G. Shan, Z. Song, R. Yang, H. Li, and J. Qian (2016), "A homemade atomic force microscope based on a quartz tuning fork for undergraduate instruction," Am. J. Phys. 84 (6), 478 - 82.
Pahlmeyer, M., A. Hankins, S. Tuppan, and W. J. Kim (2015), "Scanning capacitance microscopy using a relaxation oscillator," Am. J. Phys. 83 (2), 104 - 9.
Greczylo, T. and E. Debowska (2006), "The macroscopic model of an atomic force microscope in the students' laboratory," Eur. J. Phys. 27 (3), 501-13.
Guerra-Vela, C. and F. R. Zypman (2002), "The poor man's scanning force microscope," Eur. J. Phys. 23 (2), 145-53.
Ng, T. W. and S. Thirunavukkarasu (2006), "Cantilever deflection profile in scanning probe microscopy," Eur. J. Phys. 27 (4), 969-73.
Rousier, R., P. Vairac, and B. Cretin (2001), "Measurement of the contact potential difference with an electrostatic force microscope," Eur. J. Phys. 22 (6), 657-62.
Zypman, F. R. and C. Guerra-Vela (2001), "The macroscopic scanning force `microscope'," Eur. J. Phys. 22(1), 17-30.
Bergmann, A., D. Feigl, D. Kuhn, M. Schaupp, G. Quast, K. Busch, L. Eichner, and J. Schumacher (2013), "A low-cost AFM setup with an interferometer for undergraduates and secondary-school students," Eur. J. Phys. (UK) 34 (4), 901 - 14.
Kontomaris, S. V. and A. Stylianou (2017), "Atomic force microscopy for university students: applications in biomaterials," Eur. J. Phys. (UK) 38 (3), 033003 (23 pp.) .
Books
Bai, C. (1995), Scanning Tunneling Microscopy and Its Application (Springer).
Chen, C. J. (1993), Introduction to Scanning Tunneling Microscopy (Oxford).
Eaton, P. and P. West (2010), Atomic Force Microscopy (Oxford Univ. Press).
Meyer, E., H. J. Hug, and R. Bennewitz (2004), Scanning Probe Microscopy (Springer).
Ohtsu, M. (1998), Near-Field Nano/Atom Optics and Technology (Springer).
Ohtsu, M., Ed. (2003), Progress in Nano-electro-optics I: Basics and Theory of Near-field Optics (Springer).
Paesler, M. A. and P. J. Moyer (1996), Near Field Optics: Theory, Instrumentation and Applications (Wiley).
Stroscio, J. A. and W. J. Kaiser, Eds. (1993), Scanning Tunneling Microscopy, Methods of Experimental Physics v. 27 (Academic Press).
Wiesendanger, R. (1994), Scanning Probe Microscopy and Spectroscopy: Methods and Applications (Cambridge).
Wiesendanger, R. and H. -J. Guntherodt, Eds. (1995), Scanning Tunneling Microscopy II, 2nd ed. (Springer).
Agar, A. W. and R. H. Alderson, and Chescoe, Dawn (1974), Principles and Practice of Electron Microscope Operation (North Holland / American Elsevier).
Andersen, C. A., Ed. (1973), Microprobe Analysis (Wiley).
Beeston, B. E. P., R. W. Horne, and R. Markham (1972), Electron Diffraction and Optical Diffraction Techniques (North-Holland / American Elsevier).
Belk, J. A. and A. L. Davies, Eds. (1968), Electron Microscopy and Microanalysis of Metals (Elsevier).
Bozzola, J. J. and L. D. Russell (1992), Electron Microscopy: Principles & Techniques For Biologists (Jones & Bartlett).
Bravman, J. C., R. M. Anderson, and M. L. McDonald (1988), Speciment Preparation For Transmission Electron Microscopy of Materials (Materials Research Society).
Breger, D. (1995), Journeys in Microspace: the Art of the Scanning Electron Microscope (Columbia University Press).
Brey, W. S. (1965), Physical Methods For Determining Molecular Geometry (Reinhold).
Brodie, I. and J. J. Muray (1982), The Physics of Microfabrication (Plenum).
Buseck, P., J. Cowley, and L. (ed. ). Eyring, Eds. (1988), High-Resolution Transmission Electron Microscopy and Associated Techniques (Oxford).
Champness, P. E. (2001), Electron Diffraction in the Transmission Electron Microscope (BIOS Scientific Publishers).
Chapman, J. N. and A. J. Craven (1984), Quantitative Electron Microscopy (Scottish Universities Summer School of Physics).
Clarke, L. J. (1985), Surface Crystallography: an Introduction to Low Energy Electron Diffraction (Wiley).
Dawes, C. J. (1979), Biological Techniques For Transmission and Scanning Electron Microscopy (Ladd Research Industries).
Dykstra, M. J. (1992), Biological Electron Microscopy (Plenum).
Ferguson, I. F. (1989), Auger Microprobe Analysis (IOP / Adam Hilger).
Forwood, C. T. and L. M. Clarebrough (1991), Electron Microscopy of Interfaces in Metals and Alloys (IOP Publishing).
Gilmore, C. P. (1972), The Scanning Electron Microscope: World of the Infinitely Small (New York Graphic Society).
Goldstein, J. I. and H. Yakowitz (1975), Practical Scanning Electron Microscopy: Electron and Ion Microprobe Analysis (Plenum).
Goldstein, J. I., D. E. Newbury, P. Echlin, D. C. Joy, C. Fiori, and E. Lifshin (1981), Scaning Electron Microscopy X-Ray Microanalysis (Plenum).
Grimstone, A. V. (1977), The Electron Microscope in Biology, 2nd ed., Studies in Biology, no. 9 (Edward Arnold).
Hall, C. E. (1966), Introduction to Electron Microscopy, 2nd ed. (McGraw Hill).
Haw, M. (2007), Middle World: the Restless Heart of Matter and Life (Macmillan).
Hawkes, P. W. (1972), Electron Optics and Electron Microscopy (Taylor & Francis).
Hayat, M. A. (1970), Principles and Techniques of Techniques of Electron Microscopy: Biological Applications, Vol. 1 (Van Nostrand Reinhold).
Heinrich, K. F. J. (1967), Scanning Electron Probe Microanalysis (U.S. Dept. of Commerce National Bureau of Standards).
Hunter, E. (1993), Practical Electron Microscopy: a Beginner's Illustrated Guide, 2nd ed. (Cambridge Univ. Press).
Hutchinson, T. E. and A. P. Somlyo, Eds. (1981), Microprobe Analysis of Biological Systems (Academic).
Joy, D. C. (1995), Monte Carlo Modeling For Electron Microscopy and Microanalysis (Oxford Univ. Press).
Kay, D. H., Ed. (1965), Techniques For Electron Microscopy (Blackwell).
Kullander, S. and B. Larsson (1994), Out of Sight! From Quarks to Living Cells (Cambridge Univ. Press).
Loretto, M. H. (1984), Electron Beam Analysis of Materials (Chapman and Hall).
Meek, G. A. (1976), Practical Electron Microscopy For Biologists, 2nd ed. (Wiley).
Mercer, E. H. and M. S. C. Birbeck (1972), Electron Microscopy: a Handbook For Biologists (Blackwell).
Murr, L. E. (1982), Electron and Ion Microscopy and Microanalysis: Principles and Applications (Dekker).
Pease, D. C. (1960), Histological Techniques For Electron Microscopy (Academic Press).
Peng, L. -M., S. L. Dudarev, and M. J. Whelan (2011), High-Energy Electron Diffraction and Microscopy (Oxford Univ. Press).
Polack, J. M. and J. V. Priestley, Eds. (1992), Electron Microscopic Immunochemistry: Principles and Practice (Oxford Univ. Press).
Reed, S. J. B. (1993), Electron Microprobe Analysis, 2nd ed. (Cambridge).
Russ, J. C. (1972), Elemental X-Ray Analysis of Materials: EXAM Methods (EDAX Laboratories).
Saxton, W. O. (1978), Computer Techniques For Image Processing in Electron Microscopy (Academic).
Slayter, E. M. and H. S. Slayter (1992), Light and Electron Microscopy (Cambridge).
Spence, J. C. H. (1981), Experimental High-Resolution Electron Microscopy (Oxford Univ. Press).
Spence, J. C. H. (1988), Experimental High-Resolution Electron Microscopy, 2nd ed. (Oxford Univ. Press).
Thomas, G. (1962), Transmission Electron Microscopy of Metals (Wiley).
Troughton, J. and L. A. Donaldson (1972), Probing Plant Structure: a Scanning Electron Microscope Study of Some Anatomical Features in Plants and the Relationship of These Structures to Physiological Processes (McGraw-Hill Book Company).
Von Heimendahl, M. (1980), Electron Microscopy of Materials: an Introduction (Academic Press).Watt, I. M. (1985), The Principles and Practice of Electron Microscopy (Cambridge Univ. Press).
Williams, D. B. and C. B. Carter (1996), Transmission Electron Microscopy: a Textbook For Materials Science Vol. I: Basics (Plenum).
Williams, D. B. and C. B. Carter (1996), Transmission Electron Microscopy: a Textbook For Materials Science Vol. II: Diffraction (Plenum).
Williams, D. B. and C. B. Carter (1996), Transmission Electron Microscopy: a Textbook For Materials Science Vol. III. Imaging (Plenum).
Williams, D. B. and C. B. Carter (1996), Transmission Electron Microscopy: a Textbook For Materials Science Vol. IV. Spectrometry (Plenum).
Williams, D. B., A. R. Pelton, and R. Gronsky (1991), Images of Materials (Oxford Univ. Press).
Gomer, R. (1961), Field Emission and Field Ionization (Harvard U. Press).
Hren, J. J. and S. Ranganathan, Eds. (1968), Field-Ion Microscopy (Plenum).
Miller, M. K., A. Cerezo, M. . Hetherington, and G. D. W. Smith (1996), Atom Probe Field Ion Microscopy (Oxford University Press).
Beeston, B. E. P., R. W. Horne, and R. Markham (1972), Electron Diffraction and Optical Diffraction Techniques (North-Holland / American Elsevier).
Cheng, P. C. and G. J. Jan, Eds. (1987), X-Ray Microscopy: Instrumental and Biological Applications (Springer).
Cohen, J. B. (1966), Diffraction Methods in Materials Science (Macmillan).
James, R. W. (1965), The Optical Principles of the Diffraction of X-Rays, The crystalline state - vol. 2 (Cornell Univ. Press).
Moore, D. M. and R. C. Reynolds, Jr. (1989), X-Ray Diffraction and the Identification and Analysis of Clay Minerals (Oxford Univ. Press).
Pecharsky, V. K. and P. Y. Zavalij (2005), Fundamentals of Power Diffraction and Structural Characterization of Materials (Springer).
Peiser, H. S., H. P. Rooksby, and A. J. C. Wilson (1955), X-Ray Diffraction of Polycrystalline Materials (Institute of Physics).
Schwartz, L. H. and J. B. Cohen (1987), Diffraction From Materials, 2nd ed. (Springer).
Stout, G. H. and L. H. Jensen (1989), X-Ray Structure Determination: a Practical Guide, 2nd ed. (Wiley).
Taylor, C. A. and H. Lipson (1965), Optical Transforms: Their Preparation and Application to X-Ray Diffraction Problems (Cornell Univ. PRess).
Allen, T. (1990), Particale Size Measurement, 4th ed. (Chapman and Hall).
Amato, J. A. (2000), Dust: a History of the Small & the Invisible (Univ. of California Press).