Resources
Low-cost capacitance profiling of a semiconductor (lab manual – Reed College – John Essick)
Journal papers
Dilshad, K. and M. K. Rabinal (2019), "Experiment with Schottky junction: estimation of metal-semiconductor interface parameters," Eur. J. Phys. (UK) 40 (3), 035502 (11 pp.).
Reynolds, N. D., C. D. Panda, and J. M. Essick (2014), "Capacitance-voltage profiling: Research-grade approach versus low-cost alternatives," Am. J. Phys. 82 (3), 196 - 205.
Wood, M. J. (1985), "Microcomputer controlled C-V plotting in semiconductor devices," Phys. Educ. 20, 305-309.
Books
Henisch, H. K. (1957), Rectifying Semi-conductor Contacts (Oxford Univ. Press).
Lampert, M. A. and P. Mark (1970), Current Injection in Solids (Academic Press).
Rhoderick, E. H. and R. H. Willams (1988), Metal-Semiconductor Contacts, 2nd ed. (Oxford Univ. Press).
Schwartz, B., Ed. (1969), Ohmic Contacts to Semiconductors (Electrochemical Society).