Projects

Built-In Self-Test of High Speed Analog-to-Digital Converters (ADC BIST)

As the conversion rate trend of analog-to-digital converters (ADCs) keeps increasing, from the present state of few gigasamples per second range, their testing is becoming progressively more challenging. Aware to this fact, in this project we investigate a new solution to this problem. Specifically, we propose to use two small area oscillators inserted into two phase-locked loops (PLLs) to generate a sinusoidal signal as well as a clock signal and, on the digital side, to employ straightforward digital signal processing (DSP) techniques to dynamically and functionally test high speed and moderate resolution ADCs.

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