System Reliability

[TOC 2018] Configurable-ECC: Architecting a Flexible ECC Scheme to Support Different Sized Accesses in High Bandwidth Memory Systems

  • Hsing-Min Chen, Shin-Ying Lee, Trevor Mudge, Carole-Jean Wu, and Chaitali Chakrabarti. In Proceedings of the IEEE Transactions on Computers (TOC), 2018.

[TACO 2016] RATT-ECC: Rate Adaptive Two-Tiered Error Correction Codes for Reliable 3D Die-Stacked Memory

  • Hsing-Min Chen, Carole-Jean Wu, Trevor Mudge, and Chaitali Chakrabarti. In Proceedings of the ACM Transactions on Architecture and Code Optimization, June 2016.

[TC 2016] Using Low Cost Erasure and Error Correction Schemes to Improve Reliability of Commodity DRAM Systems

  • Hsing-Min Chen, Supreet Jeloka, Akhil Arunkumar, David, Blauuw, Carole-Jean Wu, Trevor Mudge, and Chaitali Chakrabarti. In Proceedings of the IEEE Transactions on Computers, April 2016.

[MEMSYS 2015] E-ECC: Low Power Erasure and Error Correction Schemes for Increasing Reliability of Commodity DRAM Systems

  • Hsing-Min Chen, Akhil Arunkumar, Carole-Jean Wu, Trevor Mudge, and Chaitali Chakrabarti. In Proceedings of the International Symposium on Memory Systems, 2015.

[DAC 2014] Quantitative Analysis of Control Flow Checking Mechanisms for Soft Errors

  • Aviral Shrivastava, Abhishek Rhisheekesan, Reiley Jeyapaul, and Carole-Jean Wu. In Proceedings of the 51st Annual Design Automation Conference, 2014.