Testimony from SEA users

“We use Time-of-Flight Secondary Ion Mass Spectroscopy (ToF-SIMS) to investigate the segregation of bottlebrush polymers with mixed polystyrene (PS) and polymethyl methacrylate (PMMA) side-chains in a linear polymer matrix. In particular, ToF-SIMS depth profiling with argon cluster sputtering has been useful to elucidate the distribution of bottlebrush polymers as a function of thermal annealing time, linear polymer molecular weight, and side-chain composition” – Hao Mei, 03/2019

“Dopant distribution is of great significance to the optimization of semiconductor devices. Our lab utilize the ToF-SIMS system to gather depth profile data. The data is instructive in the sense that our processing conditions must be modified accordingly in order to suppress diffusion between different layers ” – Bo Yu, 03/2020

“The Torres lab group is utilizing the ToF-SIMS facility at Rice to image the molecular composition of natural organic matter in sediment and rock samples. The mechanisms underlying the preservation of organic matter in the environment remain obscure, but directly relate to the presence of oxygen in our atmosphere, the formation of hydrocarbon resources, and our understanding of changes in Earth’s climate over geologic time. The ToF-SIMS technique can provide fresh insights into this problem by revealing the composition of preserved organic matter in the context of the physical structure and inorganic composition of each sample” – Prof. Mark Torres, 05/2020