ISOT2026 Program & Proceedings

Day 1 (April 27) @Miyajima Coral Hotel

8:15 Registration Open

9:00 [Opening Remarks]
Ryoichi Kuwano, Hiroshima Institute of Technology, Japan

9:05 [Session 1-1]
Chair:
Ryoichi Kuwano, Hiroshima Institute of Technology, Japan

9:05 [Invited] (I-1) Phase retrieval technique from regions of unresolvable fringe density using Phase Shifting Interferometry and Liquid Crystal on Silicon (LCOS) Spatial Light Modulator (SLM)
Indrani Bhattacharya
India

9:35 [Invited] (I-2) Low coherent interferometry for quantitative inspection
Rakesh Kumar Singh
Indian Institute of Technology BHU, India

10:05 [Invited] (I-3) Study on Fusion micro-welding of glass by multi-spot focusing of picosecond pulsed laser
Yasuhiro Okamoto1, Shuhei Hiramatsu2, Subaru Ishiyama1, Junhao Zhou1,
Akira Okada2
1 Hiroshima University, 2 Okayama University, Japan 

▌10:35 < Networking Coffee Break>  ▌

11:05 [Session 1-2]
Chair:
Wei-Chih Wang, University of Washington, USA

11:05 [Invited] (I-4) Advanced Non-contact Sensing Technology Using Laser Dynamics
Yanguang Yu
University of Wollongong, Australia

11:35 [Invited] (I-5) 3D Shape Measurement via CG and Deep Learning: Virtual-to-Real Approaches for Challenging Surfaces
Kanami Ikeda
Osaka Metropolitan University, Japan

12:05 [Invited] (I-6) Toward an XAI-Based Measurement Systems for Scalable Process Control
Panart Khajornrunruang1, Hideki Ina2,
1Kyushu Institute of Technology, 2illuminus, Japan

▌12:35 < Lunch> ▌

14:05 [Session 1-3]
Chair:
Liang Chia Chen, National Taiwan University, Taiwan

14:05 [Selected] (S-1) In-situ measurement of sub micro-optical fiber diameter　based on effective refractive index
Masaki Michihata, Yushen Liu, Shuzo Masui, Satoru Takahashi
The University of Tokyo, Japan

14:25 [Selected] (S-2) Investigation of an optical sensor for three-axis angle measurement employing machine learning
Ryo Sato, Misaki Hosoya, Wei Gao
Tohoku University, Japan

14:45 [Selected] (S-3) Snapshot fringe projection profilometry with spectrally encoded fringes
Nathan Hagen, Tomoya Hoshino
Utsunomiya University, Japan

▌15:05 < Networking Coffee Break> ▌

15:20 [Session 1-4]
Chair:
Kosuke Asano, Canon Inc., Japan;
Ryo Sato, Tohosku University, Japan 

15:20 [Selected] (S-4) Probe-based scanning laser ablation using a photonic nanojet
Tsutomu Uenohara, Seira Takeuchi, Yasuhiro Mizutani, Yasuhiro Takaya
The University of Osaka, Japan

15:40 [Selected] (S-5) Optical Properties of Carboxyl-Terminated Silicon Nanocrystals Derived from Rice Husks
Kimihisa Matsumoto, Taisei Matsusita, Hitoshi Mizuno, Yuichi Ota,
Kazuhide Kamiya, So Ito
Toyama Prefectural University, Japan

16:00 (O-1) Digital holography with a high-framerate linear imager
Yuma Sato, Akanksha Gautam, Ryoma Akahoshi, Yoshio Hayasaki
Utsunomiya University, Japan

16:15 (O-2) Electro-Optic Beam Steering in Two Dimensions Using Liquid Crystal Devices
Wei-Chih Wang12, Aditya Sharma2, Vinayak Ghorapade2
1 University of Washington, USA
2 National Tsing Hua University, Taiwan

16:30 (O-3) Prototype of a nanometer-scale phase-shifting stage using beam deflection in elastic materials for laser interferometry
Ryunosuke Hayashi, Motoharu Fujigaki
University of Fukui, Japan

▌16:45 < Networking Coffee Break>  ▌

17:00 [Session 1-5]
Chair: Tsutomu Uenohara, The University of Osaka, Japan;
Yanguang Yu, University of Wollongong, Australia;
David Ignacio Serrano García, Universidad de Guadalajara, Mexico

17:00 (O-4) Quantitative Analysis of Numerical Refocusing in Digital Holographic Microscopy with Application to Through-Glass Via Metrology for Advanced Semiconductor Packaging
Surajit Das, Sebastian Valderrama, Luis Najera, Arigna, Rasphone, Liang Chia Chen
National Taiwan University, Taiwan

17:15 (O-5) Single-exposure Polarization Digital Holographic Microscopy  (SPDHM) for Quantitative Stress Metrology in Laser-modified Glass Substrates for Advanced Packaging
Luis Najera, Surajit Das, Sebastian Valderrama, Arigna, Rasphone, Liang Chia Chen
National Taiwan University, Taiwan

17:30 (O-6) A Reduced-Structure of Linear LED Fringe Projection Unit  for Feature Quantity Type Whole-Space Tabulation Method
Phing Lim, Motoharu Fujigaki
University of Fukui, Japan

17:45 (O-7) A Millimeter-Wave-Based Non-Contact Vibration Detection System for Diagnostic Evaluation of Production Equipment
Ayato Iba, Yuji Matsuzoe
Asahikasei, Japan

18:00 (O-8) Optical design and modelling of wavelength-scale photonic devices for displays and sensing
Saswatee Banerjee
Photonic Wave Solutions LLC, India

18:15 (O-9) Principle Study on Ultrasonic Signal Reception Using Laser-Based Methods
Weichen Zhang1, Hiroshige Kikura1, Naruki Shoji2, Hideki Kawai2
1 Institute of Science Tokyo, Japan
2 Muroran Institute of Technology, Japan 

18:30 [Selected] (S-6) The Nonstandard Finite-Difference Time-Domain Methodology to Solve Nonlinear Problems
James Cole
University of Tsukuba, Japan  

19:00 Welcome Reception

Day 3 (April 29) @Miyajima Town Planning Exchange

8:30 Registration Open

9:00 [Session 3-1]
Chair:
Yukitoshi Otani, Utsunomiya University, Japan

9:00 [Invited] (I-15) Establishing a measurement setup for the traceable measurement of the Modulation Transfer Function MTF
Hanno Dierke, Markus Schake
hysikalisch-Technische Bundesanstalt, PTB, Germany

9:30 [Invited] (I-16) Setup and calibration of multicamera systems for problem-specific applications in biomechanics
Katia Genovese
University of Basilicata, Italy

10:00 [Invited] (I-17) Advanced interferometric spectral optical metrology
Daesuk Kim, Saeid Kheiryzadehkhanghah, Gukhyeon Hwang
Jeonbuk National University, Korea

▌10:30 < Coffee Break & Poster> ▌

11:00 [Session 3-2]
Chair:
Yusuke Kajihara, The University of Tokyo, Japan

11:00 [Invited] (I-18) Channeled Spectropolarimetric Microscope
Kazuhiko Oka, Gaku Tanizaki, Xiaoshuai Chen
Hirosaki University, Japan

11:30 [Invited] (I-19) Structured illumination and detection strategies in 3D high-fidelity imaging
Genaro Saavedra-Tortosa, Manuel Martinez-Corral
Universitat de València, Spain

12:00 [Invited] (I-20) Cellular Structural Dynamics via Polarization Microscopy
David Ignacio Serrano García
Universidad de Guadalajara, Mexico

▌12:30 < Lunch & Poster > ▌

14:00 [Session 3-3]
Chair:
Yu-Lung Lo, National Cheng Kung University, Taiwan;
Masaki Michihata, The University of Tokyo, Japan

14:00 [Invited] (I-7) Toward the Future of DLP Printing through Multi-Material and Multi-AxisFabrication
Yam Yeung
The Chinese University of Hong Kong, China 

14:20 [Selected] (S-7) A Framework and Feasibility Study on Light-Field Imaging for Cast Surface Inspection
Yoshihiro Mizutani1, Okiharu Kirino2
1 Institute of Science Tokyo,
2 Anax Optics Inc., Japan

14:40 (O-13) Passive Near-Field Microscopy of Thermal Evanescent Fields on Ultrathin Gold Films across the Metal-Insulator Transition
Kuan-Ting Lin, Yinghui Liang, Yongzhi Wang, Yusuke Kajihara
The University of Tokyo, Japan

14:55 (O-14) Imaging hot carriers in power semiconductor through passive scattering-type scanning near-field optical microscopy
Guokang Zhang, Kuan-Ting Lin, Ziyi Xu, Yongzhi Wang, Zhenghua An,  Yusuke Kajihara
The University of Tokyo, Japan

15:10 (O-15) Process Control by Monitoring Ambient Conditions Around the Grinding Area Utilizing Thermopile-Array-Sensor
Genki Tanaka, Kiyoshi Yanagihara
National Institute of Technology , Ariake College, Japan

15:25 (O-16) A Polymer Optical Fiber Intensity-Modulated Sensor for Dynamic Displacement Measurement
Wei-Chih Wang12, Aditya Sharma2 Vinayak Ghorapade2, Pratheeksha Srinivasu2
1 University of Washington, USA
2 National Tsing Hua University, Taiwan

15:40 (O-17) A Fundamental Study toward Visual Testing Using a Neural Network with Explicit Color-Aware Architecture
Hibiki Shiraishi, Yoshihiro Mizutani
Institute of Science Tokyo, Japan

15:55 [Closing Remarks]
Ryoichi Kuwano, Hiroshima Institute of Tehcnology, Japan