Nanosurf NaioAFM Atomic Force Microscopes
Nanosurf NaioAFM Atomic Force Microscopes
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Features
Features
Static force ("contact mode") and dynamic force ("tapping mode") scan modes available
Magnetic force microscopy (MFM) scan mode available
Top and side view cameras
Spectrscopy scans (force vs. Z-scanner position) capable
Cantilevers pre-aligned in scan head
Routines for cantilever stiffness, cantilever resonant frequency, and photodiode calibration built into control software
Files Associated with Instrument
Files Associated with Instrument
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