Citing Articles

2018 {1}

· Alessandro Molle, Carlo Grazianetti, Li Tao, Deepyanti Taneja, Md. Hasibul Alam, and Deji Akinwande, "Silicene, silicene derivatives, and their device applications", Chem. Soc. Rev. 47, 6370-6387 (2018).

2019 {4}

· Vitaly I. Korepanov, Si-Yuan Chan, Hsu-Cheng Hsu, and Hiro-o Hamaguchi, "Phonon confinement and size effect in Raman spectra of ZnO nanoparticles", Heliyon 5, e01222 (2019).

· Ajit K. Katiyar, Ashwini Ann Davidson, Houk Jang, Yun Hwangbo, Byeori Han, Seonwoo Lee, Yohei Hagiwara, Takahiro Shimada, Hiroyuki Hirakata, Takayuki Kitamurac, and Jong-Hyun Ahn, "Ultrasoft silicon nanomembranes: thickness-dependent effective elastic modulus ", Nanoscale 11, 15184-15194 (2019).

· Qi Wang, Ruiqiang Guo, Cheng Chi, Kai Zhang, and Baoling Huang, "Direct first-principle-based study of mode-wise in-plane phonon transport in ultrathin silicon films", Int. J. Heat Mass Transf. 143, 118507 (2019).

· Ľubomír Vančo, Mário Kotlár, Magdaléna Kadlečíková, Viliam Vretenár, Marian Vojs, and Jaroslav Kováč Jr., "Interference-enhanced Raman scattering in SiO2/Si structures related to reflectance", J. Raman Spectrosc. 50, 1502-1509 (2019).

2020 {2}

· Vitaly I. Korepanov, "Localized phonons in Raman spectra of nanoparticles and disordered media", J. Raman Spectrosc. 51, 881-891 (2020).

· Lixiang Liu, Jiawei Wang, Steffen Oswald, Junping Hu, Hongmei Tang, Jinhui Wang, Yin Yin, Qiongqiong Lu, Lifeng Liu, Enrique Carbo-Argibay, Shaozhuan Huang, Haiyun Dong, Libo Ma, Feng Zhu, Minshen Zhu, and Oliver G. Schmidt, "Decoding of Oxygen Network Distortion in a Layered High-Rate Anode by In Situ Investigation of a Single Microelectrode", ACS Nano 14, 11753-11764 (2020).

2021 {2}

· Vladimir Poborchii, Jesse Groenen, Pavel I. Geshev, Junichi Hattori, Wen Hsin Chang, Hiroyuki Ishii, Toshifumi Irisawa, and Tatsuro Maeda, "Optical study of electron and acoustic phonon confinement in ultrathin-body germanium-on-insulator nanolayers", Nanoscale 13, 9686-9697 (2021).

· Arijit Sarkar, Yongjun Lee, and Jong-Hyun Ahn, "Si nanomebranes: Material properties and applications", Nano Res. 14, 3010-3032 (2021).

2022 {3}

· Kangsik Kim, Seungwoo Son, Seonwoo Lee, Jong-Hyun Ahn, and Zonghoon Lee, "In Situ Transmission Electron Microscopy Observation of 3C-SiC Heteroepitaxial Growth on Si Nanomembrane", Microsc. Microanal. 28, 1832-1833 (2022).

· Ľubomír Vančo, Mário Kotlár, Viliam Vretenár, Magdaléna Kadlečíková, Marian Vojs, and Peter Vogrinčič, "Correlated reflectance and Raman spectroscopy in substrates with coherent transparent layers", Surf. Interfaces 34, 102309 (2022).

· Ruijie Wang, Qilong Cui, Wen Zhu, Yijie Niu, Zhanfeng Liu, Lei Zhang, Xiaojun Wu, Shuangming Chen, and Li Song, "In-plane optical anisotropy of two-dimensional VOCl single crystal with weak interlayer interaction", Chinese Phys. B 31, 096802 (2022).

2023 {1}

· Zhongwei Zhang, Yangyu Guo, Marc Bescond, Masahiro Nomura, Sebastian Volz, and Jie Chen, "Assessing Phonon Coherence Using Spectroscopy", Phys. Rev. B 107, 155426 (2023). See also: arXiv:2206.12172.

2024 {3}

· Ajit K. Katiyar, Beom Jin Kim, Gwanjin Lee, Youngjae Kim, Justin S. Kim, Jin Myung Kim, SungWoo Nam, JaeDong Lee, Hyunmin Kim, Jong-Hyun Ahn, "Strain modulation in crumpled Si nanomembranes: Light detection beyond the Si absorption limit", Sci. Adv. 10, eadg7200 (2024).

· Jijun Zhang, Rong Sun, Yanqi Ge, Jingyi Wang, Zexuan Wang, Lijian Meng, Francis Leonard Deepak, Min Zhang, Peng Yin, Faliang Cheng, Zhiming Wang, and Zhongchang Wang, "Atomic-scale structure and nonlinear optical absorption of two-dimensional GeS", J. Mater. Sci. Technol. 187, 188-194 (2024).

· Seonwoo Lee, Tetsuo Kishi and Yves Bellouard, "Wide-Field Polarimetric Second-Harmonic Imaging for Rapid and Nondestructive Investigation of Laser-Induced Crystallization Phenomena", Nano Lett. 18, 24929-24940 (2024).

2025 {1}

· Ziyu Zhang, Yang Wang, Tianjun Cai, Binmin Wu, Bofan Hu, Xing Li, Enming Song, Gaoshan Huang, Ziao Tian, Zengfeng Di, and Yongfeng Mei, "Recent Progress on Flexible Silicon Nanomembranes for Advanced Electronics and Optoelectronics", Adv. Funct. Mater. 35, 2502191 (2025).