H. Matsukawa, M. Takenaka, S. Takagi, and K. Toprasertpong, “Dynamic dielectric-constant enhancement in Hf1-xZrxO2 high-k dielectrics revealed by fast C–V measurement,” Jpn. J. Appl. Phys. 65, p. 100901 (1-5), May 18, 2026. (DOI: 10.35848/1347-4065/ae6765)

E. Nako, R. Nakane, M. Takenaka, K. Toprasertpong, and S. Takagi, “Substrate-Voltage-Controlled Temporal Nonlinearity in Ferroelectric FET-based Reservoir Computing”, APL Machine Learning, vol. 4, 026102 (1-10), April 16, 2026. (DOI: 10.1063/5.0329212) 

H. Sakumoto, T. Piyapatarakul, K. Toprasertpong, S. Takagi, and M. Takenaka, “Low-loss, low-power, MOSCAP optical phase shifter on InP membrane platform”, Opt. Exp., vol. 34, Issue 7, pp. 13142-13152, 6 April 2026. (DOI: 10.1364/OE.589644)

K. Toprasertpong, Z. Liu, K. Ito, H. Matsukawa, K. Tahara, M. Takenaka, and S. Takagi, “Ultra-thin ferroelectric HfZrO2 for low-power nonvolatile memory: What are its challenges?,” Invited talk, the 9th International Conference on Electronic Materials and Nanotechnology for Green Environment (ENGE 2026), Jeju, Korea, Nov. 15-18, 2026. 

Z. Liu, K. Ito, M. Takenaka, S. Takagi, K. Toprasertpong, “Charge Injection-Based Framework for Understanding Imprint, Wake-up, and Fatigue in HZO Ferroelectric Capacitors”, invited talk, 2026 Fall Meeting & Exhibit of the European Materials Research Society (E-MRS), the University of Technology in Warsaw, Warsaw, Poland, September 14-17, 2026.

K. Toprasertpong, Z. Liu, K. Ito, H. Matsukawa, K. Tahara, M. Takenaka, and S. Takagi, “Low-Voltage Ferroelectric Memory Enabled by Ultra-thin Hf1-xZrxO2: Scaling Benefits and Reliability Trade-Offs”, invited, 84th Device Research Conference (DRC 2026), Ann Arbor, Michigan, USA, June 21-24, 2026.

T. Liu, Z. Liu, K. Ito, Z. Jin, S. Takagi, M. Takenaka, K. Toprasertpong, “Frequency-dependent field cycling for imprint recovery in ultra-thin Hf0.5Zr0.5O2 ferroelectric capacitors”, 9.1, p. 51-52, Silicon Nanoelectronics Workshop (SNW 2026), Hilton Hawaiian Village, Honolulu, HI, USA, June 13-14, 2026.

Z. Liu, M. Takenaka, S. Takagi, K. Toprasertpong, “Unveiling Underlying Mechanism of Fatigue in HfO2-Based Ferroelectric Films: Imprint as the Origin of Fatigue”, 6.3, p.39-40, Silicon Nanoelectronics Workshop (SNW 2026), Hilton Hawaiian Village, Honolulu, HI, USA, June 13-14, 2026.

S. Takagi, K. Sumita, Z. Jin, Y. Chen, M.-S. Kang, M. Takenaka and K. Toprasertpong, “Understanding of Carrier Transport Properties in Si Cryo-CMOS”, plenary talk, 1.1, p. 1-2, Silicon Nanoelectronics Workshop (SNW 2026), Hilton Hawaiian Village, Honolulu, HI, USA, June 13-14, 2026.

K. Toprasertpong, Z. Liu, K. Ito, H. Matsukawa, K. Tahara, M. Takenaka, and S. Takagi, “Thickness scaling of ferroelectric Hf1-xZrxO2: Opportunities for low-voltage memory and its challenges,” Invited talk, Global Conference of Innovation Materials 2026 (GCIM2026) & MRS-K, Jeju, Korea, May. 31-Jun. 4, 2026.

高木信一, “MOSFETの動作原理と発展”, 2026年度 応用物理学会 東海支部主催 基礎セミナー「電界効果トランジスタ(MOSFET)動作の基礎と新コンピューティング」, 愛知工業大学　本山キャンパス, 2026年6月26日.