Conferences

A. Gupta, S. F. Naz, and A. P. Shah, “A Configurable RO-PUF with Improved Thermal Stability for Lightweight Applications”, 36th IEEE International Conference on Microelectronics (ICM 2024) (Accepted).
A. Sharma, S. F. Naz, and A. P. Shah, “Secure and reliable single-ended 10T SRAM cell,” in 2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM). IEEE, 2024, pp. 1–3.

D. Mondal, S. F. Naz, and A. P. Shah, “Radiation hardened and leakage power attack resilient 12T SRAM cell for secure nuclear environments,” in Proceedings of the Great Lakes Symposium on VLSI 2023, 2023, pp. 227–228.
S. F. Naz, M. Chawla, and A. P. Shah, “Leakage power attack and half select issue resilient split 8T SRAM cell,” in 2023 21st IEEE Interregional NEWCAS Conference (NEWCAS). IEEE, 2023, pp. 1–2.

S. F. Naz, S. Khan, and A. P. Shah, “Pass transistor XOR gate based radiation hardened RO-PUF,” in International Symposium on VLSI Design and Test. Springer, 2022, pp. 331–344.
P. Sinha, A. Sharma, N. Naharas, S. F. Naz, and A. P. Shah, “QCA technology based 8-bit TRNG design for cryptography applications,” in International Symposium on VLSI Design and Test. Springer, 2022, pp. 345–357.
A. Maurya, A. Singh, S. F. Naz, and A. P. Shah, “Metastable SR flipflop based true random number generator using QCA technology,” in International Symposium on VLSI Design and Test. Springer, 2022, pp. 292–304.

S. F. Naz, S. Ahmed, S. Sharma, F. Ahmad, and D. Ajitha, “Fredkin gate based energy efficient reversible D flip flop design in quantum-dot cellular automata,” Materials Today: Proceedings, vol. 46, pp. 5248– 5255, 2021. (Best Paper Award)
S. F. Naz, A. P. Shah, S. Ahmed, P. Girard, and M. Waltl, “Design of fault-tolerant and thermally stable XOR gate in quantum dot cellular automata,” in 2021 IEEE European Test Symposium (ETS). IEEE, 2021, pp. 1–2.

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