Journal Articles
In Preparation
7. Mogere, K., Kamal, S., & Hailstone, R. (2025). Realistic Simulation of SEM Image Noise using Generative Adversarial Networks. (To be submitted)
6. Kamal, S. & Hailstone, R. (2025). Theory and Applications of Sub-Poisson Electron Emission. (To be submitted)
5. Kamal, S., Mogere, K., & Hailstone, R. (2025). Sub-Poisson Sources and Their Effects on Scanning Electron
Microscopy Images. (To be submitted)
Prepress
4. Kamal, S., Prajapati, H., Cahill, N., & Hailstone, R. (2025). Aberration Diagnostic Method Based on Machine
Learning for the Uncorrected Scanning Electron Microscope, (Submitted).
3. Kamal, S., & Hailstone, R. (2025). Point-Spread Function of the Optics in Scanning Electron Microscopes, (Submitted). https://arxiv.org/abs/2407.01439
Published
2. Kamal, S., Zhou Y., & Gong, J. (2024). Wave Optical Modeling of SEM Column From Source to Specimen. Microscopy and Microanalysis. https://doi.org/10.1093/mam/ozae072
1. Kamal, S., & Hailstone, R. (2022). SEM Nano: An Electron Wave Optical Simulation for the Scanning Electron Microscope. Microscopy and Microanalysis. https://doi.org/10.1017/S1431927622000198
Conference Proceedings
Published
10. Mogere, K., Kamal, S., & Hailstone, R. (2025). Scanning Electron Microscopy Noise Classification Using Machine Learning. Microscopy and Microanalysis.
https://doi.org/10.1093/mam/ozaf048.236
9. Kamal, S., Mogere, K., & Hailstone, R. (2025). Experimental Analysis of Detector Noise in Scanning Electron Microscopy. Microscopy and Microanalysis.
https://doi.org/10.1093/mam/ozaf048.213
8. Kamal, S., & Hailstone, R. (2025). Progress in Squeezed States of Electron Illumination. Microscopy and Microanalysis. https://doi.org/10.1093/mam/ozaf048.872
7. Kamal, S., & Hailstone, R. (2024). Visualizing the Point-Spread Function of the SEM Optics. Microscopy and Microanalysis. https://doi.org/10.1093/mam/ozae044.320
6. Kamal, S., & Hailstone, R. (2023). Electron Vortex Beam and Probe Phase in Scanning Electron Microscopy. Microscopy and Microanalysis. https://doi.org/10.1093/micmic/ozad067.231
5. Kamal, S., & Hailstone, R. (2023). Electron Probe Phase using Defocus in Scanning Electron Microscopy. Microscopy and Microanalysis. https://doi.org/10.1093/micmic/ozad067.213
4. Kamal, S., & Hailstone, R. (2023). Need for Wavefront Sensing in Scanning Electron Microscopy. Microscopy and Microanalysis. https://doi.org/10.1093/micmic/ozad067.233
3. Kamal, S., Prajapati, H., Cahill, N., & Hailstone, R. (2023). Probe Aberration Correction in Scanning Electron Microscopy using Artificial Neural Networks. Microscopy and Microanalysis. https://doi.org/10.1093/micmic/ozad067.364
2. Kamal, S., & Hailstone, R. (2023). Quantum Wavefunction Reconstruction of Electron Beam in Scanning Electron Microscopy. Proc. SPIE 12447, Quantum Sensing, Imaging, and Precision Metrology, 124470R; https://doi.org/10.1117/12.2647634
1. Kamal, S., & Hailstone, R. (2021). Modeling SEM Column, Probe Formation, and Imaging using Fourier Optics. Microscopy and Microanalysis, 27(S1), 3336-3337. https://doi.org/10.1017/S1431927621011466