Journal Articles 

       3. Kamal, S., & Hailstone, R. (2024).  Point-Spread Function of the Optics in Scanning Electron Microscopes. Physical Review Letters, (Under Review),     https://arxiv.org/abs/2407.01439

2.  Kamal, S.,  Zhou Y., & Gong, J. (2024). Wave Optical Modeling of SEM Column From Source to Specimen. Microscopy and Microanalysis. https://doi.org/10.1093/mam/ozae072

1.  Kamal, S., & Hailstone, R. (2021). SEM Nano: An Electron Wave Optical Simulation for the Scanning Electron Microscope. Microscopy and Microanalysis.   doi:10.1017/S1431927622000198

Conference Proceedings 

7. Kamal, S., & Hailstone, R. (2024). ‘Visualizing the Point-Spread Function of the SEM Optics’. Microscopy and Microanalysis, (Accepted)

6.  Kamal, S., & Hailstone, R. (2023). ‘Electron Vortex Beam and Probe Phase in Scanning Electron Microscopy’. Microscopy and Microanalysis, (Accepted) 

5.  Kamal, S., & Hailstone, R. (2023). ‘Electron Probe Phase using Defocus in Scanning Electron Microscopy’. Microscopy and Microanalysis, (Accepted) 

4.  Kamal, S., & Hailstone, R. (2023). ‘Need for Wavefront Sensing in Scanning Electron Microscopy’. Microscopy and Microanalysis, (Accepted)

3.  Kamal, S., Prajapati, H., Cahill, N., & Hailstone, R. (2023). ‘Probe Aberration Correction in Scanning Electron Microscopy using Artificial Neural Networks’. Microscopy and Microanalysis, (Accepted) 

2.  Kamal, S., & Hailstone, R. (2023). ‘Quantum Wavefunction Reconstruction of Electron Beam in Scanning Electron Microscopy’. Proc. SPIE 12447, Quantum Sensing, Imaging, and Precision Metrology, 124470R; https://doi.org/10.1117/12.2647634 

1.  Kamal, S., & Hailstone, R. (2021). Modeling SEM Column, Probe Formation, and Imaging  using Fourier Optics. Microscopy and Microanalysis, 27(S1), 3336-3337.   doi:10.1017/S1431927621011466