Journal Papers

1. Jaiswal, S., Kuriachen, B., & Mathew, J. (2023). Experimental investigation into the evolution of microstructure and nanomechanical characterization of electric discharge deposited surface layers on Ti64. Measurement, 112544. https://doi.org/10.1016/j.measurement.2023.112544

2. M Subhakar, L. Pandey, S. Chaudhary, S.P. Jaiswal, S.S Singh, U. Mahmud, Y.L. Chiu, I.P. Jones, J. Jain, Tuning Substrate Temperature for Improved Adhesion and Mechanical Properties of Magnetron Sputtered High Entropy Alloy Thin-Films, Thin Solid Films, 2025, 140817,  https://doi.org/10.1016/j.tsf.2025.140817.

3. Harun, B., Kumar, R., Jaiswal, S., Huang, E.W., Chang, Y.J., Yeh, A.C., Singh, S.S., Neelakantan, S. and Jain, J., 2026. Hot deformation behavior and processing map development of Al0. 3Co1. 5CrFeNi1. 5Ti0. 2 high-entropy alloy: Mechanisms and microstructural evolution. Intermetallics, 188, p.109071. https://doi.org/10.1016/j.intermet.2025.109071 

Conference 

1. Jaiswal, S., Prajina, N. V., Kuriachen, B., & Mathew, J. (2022). Effect of Peak Current and Pulse-On Time on MRR and TWR in EDM of Ti-6Al-4 V. In Advances in Modern Machining Processes: Proceedings of AIMTDR 2021 (pp. 29-38). Singapore: Springer Nature Singapore. .https://doi.org/10.1007/978-981-19-7150-1_3 

2. Shubham Jaiswal, S. Panda, J. Jain and S. S. Singh, Elucidating the Deformation Characteristics of as-cast Nb-Co-Al Alloys, IIM-ATM 2023

3. Shubham Jaiswal, Subha Sanket Panda, Jayant Jain and Sudhanshu Shekhar Singh, Evolution of Microstructure and Mechanical Properties of Nb-Co-Al Alloys, International Conference on Electron Microscopy and XLII Annual Meeting of the Electron Microscope Society of India (EMSI-2024)

4. Jaiswal S.P., Panda S.S., Jain J., Singh, S.S., Development of Nb-Al-Co Alloys for High Temperature Applications, MSE 2024 (Congress & Exhibition), Technical University Darmstadt

5. Shubham Jaiswal,  Jayant Jain and Sudhanshu Shekhar Singh, Effect of Aluminium Addition on Microstructure and Mechanical Properties of Nb-5Co Alloys, International Conference on Electron Microscopy and XLIII Annual Meeting of the Electron Microscope Society of India (EMSI-2025)