Resource
Semiconductor, Energy, SensorWe, Xlab, provide many opportunities for students to learn the-state-of-the-art resources of science and engineering.
Fabrication of films and nanostructures
Pulsed Nd:YAG laser deposition
RF magnetron sputter deposition
Atomic layer deposition
Thermal evaporation
Photolithography
Characterization of structural property
X-ray diffractometer (PANalytical Empyrean)
X-ray diffraction (Pohang Accelerator Laboratory 3A beamline)
Transmission electron microscope
Characterization of electrical property
Physical property measurement system (Quantum Design)
Sourcemeter (Keithley 2450)
Ferroelectric tester (Radiant Technologies Precision LC II)
Atomic force microscopy (Park systems XE7): Piezoelectric, Electrostatic, Conductive
X-ray absorption spectroscopy (Pohang Accelerator Laboratory 2A & 6A beamline)
X-ray linear dichroism (Pohang Accelerator Laboratory 2A & 6A beamline)
Characterization of magnetic property
Magnetic property measurement system (Quantum Design)
X-ray magnetic circular dichroism (Pohang Accelerator Laboratory 2A beamline)
Characterization of optical property
Spectroscopic ellipsometer (J. A. Woollam Co. M-2000 & IR-VASE Mark II)
UV-Vis-NIR spectrophotometer (Agilent Technologies Cary 5000)
Fourier transform infrared microscope (Thermo Scientific Nicolet Continuum)
Scattering scanning near-field optical microscopy (Pohang Accelerator Laboratory 12D beamline)
Characterization of chemical property
Battery coin cell assembly kit in glove box
Gas tube sensor
Impedance/Gain-phase analyzer (Solartron 1260A)