Quantum metrology with a limited number of measurements
We develop quantum-metrology methods for the few-shot regime, where only a limited number of measurements is available. We seek fundamental precision bounds and practical estimation strategies that extract as much information as possible from scarce data, with links to quantum sensing, ultracold gases, quantum optics, and imaging.
Supported by QLiMes (PID2023-152724NA-I00; MCIU/AEI/10.13039/501100011033 and FSE+)
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