Product Information

A 4-inch silicon (100) wafer comprises 36 chips (1 cm × 1 cm each), with each chip containing 100 nMOSFETs. The overall fabrication yield is approximately 70 %. Prior to shipment, we perform in-house re-measurements of the ID–VG and ID–VD characteristics to inspect for any defective devices. Additionally, the locations of good dies are briefly screened and provided along with the samples for your convenience. 


Device I: Silicon nMOSFETs (SiO₂ Gate Dielectric)

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   [3] J.-W. Yeon et al., IEEE Trans. Device Mater. Reliab., vol. 24, no. 4,  pp. 618-623, Dec. 2024. [ Website ]  

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Device II: Silicon nMOSFETs (HKMG)

[1] S.-J. Jeon et al., Semicond. Sci. Technol. vol. 40, no. 8,  pp. 1-5, Aug. 2025. [ Website ] 

    [2] T.-H. Kil et al., IEEE J. Electron Devices Soc., vol. 12, no. 1,  pp. 1030-1033, Dec. 2024. [ Website ]