MoDLEx is a cross-platform open-source tool designed to streamline the analysis of EBIC (Electron Beam Induced Current) data. It provides researchers and materials scientists with an interface to extract carrier diffusion lengths from conductive materials using advanced fitting algorithms.
MoDLEx can offer
Dual-Signal Integration: Simultaneously view and compare EBIC and Secondary Electron (SE) images for precise alignment.
Advanced Curve Fitting: Built-in support for power-law exponents (n = -0.5 or -1.5) to match specific physical models.
Real-Time Visualization: Interactive sliders for contact adjustment and data orientation (including rotation and inverse decay).
Professional Reporting: Export high-resolution "Analysis Abstracts" (PDF/PNG) and raw fit data (CSV).