N. Chauhan, N. Bagga, S. Banchhor, A. Bulusu and S. Dasgupta, “Transient Behavior Negative capacitance with stabilization and Amplification: A Simulation Approach.” in Proc. IWPSD 2019.
N. Chauhan, C. Garg, Kai Ni, A. K. Behera, S. Yadav, S. Banchhor, N. Bagga, A. Dasgupta, A. Datta, S. Dasgupta, A. Bulusu, “Impact of Random Spatial Fluctuation in Non-Uniform Crystalline Phases on Multidomain MFIM Capacitor and Negative Capacitance FDSOI” (accepted in IRPS 2022)
N. Bagga, Kai Ni, N. Chauhan, O. Prakash, X. Sharon, H. Amrouch “Cleaved-Gate Ferroelectric FET for Reliable Multi-Level Cell Storage” (accepted in IRPS2022)
S. Banchhor, N. Bagga, N. Chauhan, S. Roy, A. Dasgupta, A. Bulusu, S. Dasgupta, “Analysis of Self-Heating in 5nm Stacked Nanosheet Transistor” (accepted in IWPSD 2021)
V. Kumar, N. Chauhan, S. Dasgupta “optimization of Negative Differential Conductance Point for Multi Gate Devices Considering Self Heating Effects Using Surface To Volume Approach” (accepted in IWPSD 2021).
S. Banchhor, N. Chauhan, A. Doneria and B. Anand, “Gain Stabilization Methodology for FinFET Amplifiers Considering Self-Heating Effect,” in Proc. VLSI Design Conference 2020.
S. Yadav, N. Chauhan, A. Pandey, R. Pratap, and A. Bulusu. "Behaviour of FinFET Inverter’s Effective Capacitances in Low-Voltage Domain." In 2021 25th International Symposium on VLSI Design and Test (VDAT), pp. 1-5. IEEE, 2021.
N. Bagga, N. Chauhan, A. Bulusu, and S. Dasgupta. "Demonstration of a Novel Ferroelectric-Dielectric Negative Capacitance Tunnel FET." IEEE Conference on Modeling of Systems Circuits and Devices (MOS-AK India), pp. 102-105,2019.
G. Bajpai, A. Gupta, N. Chauhan “Real-Time Implementation of Convolutional Neural Network to Detect Plant Diseases Using Internet of Things,” In: Sengupta A., Dasgupta S., Singh V., Sharma R., Kumar Vishvakarma S. (eds) VLSI Design and Test. VDAT 2019. Communications in Computer and Information Science, vol 1066. Springer, Singapore. https://doi.org/10.1007/978-981-32-9767-8_42.
G. Bajpai, A. Gupta, N. Chauhan “Automated Designing of Single Stage Operational Amplifier and Its Teleportation Among Different Technology Nodes” in International Conference on Electrical and Electronics Engineering (ICEEE), 2020.
N. Chauhan, G. Bajpai, S. Banchhor, N. Bagga “Analysis of Transient Negative Capacitance Characteristics for Stabilization and Amplification” Proc. in IEEE VDAT2020.
A. Gupta, N. Chauhan, O. Prakash and H. Amrouch, "On the Resiliency of NC-FinFET SRAMs against Variation: MFIS Structure," 2021 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), 2021, pp. 85-88, doi: 10.1109/SISPAD54002.2021.9592576.
A. Gupta, N. Chauhan, O. Prakash and H. Amrouch, "Variability Effects in FinFET Transistors and Emerging NC-FinFET," 2021 International Conference on IC Design and Technology (ICICDT), 2021, pp. 1-4, doi: 10.1109/ICICDT51558.2021.9626531.
Aniket Gupta, Govind Bajpai, Priyanshi Singhal, Navjeet Bagga, Om Prakash, Shashank Banchhor, Hussam Amrouch N. Chauhan, “Traps Based Reliability Barrier on Performance and Revealing Early Ageing in Negative Capacitance FET”, 2021 IEEE International Reliability Physics Symposium, 2021, pp. 1-6, doi: 10.1109/IRPS46558.2021.9405185.
A. Gupta, N. Chauhan, O. Prakash and H. Amrouch “On the Resiliency of NC-FinFET SRAMs against Variation: MFIS Structure” in 3rd IEEE CASS-RS Young Professionals (Workshop)