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About us
About us
奈米元件光學觀測實驗室
Nano Device Optical Characterization Lab.
Since 2008
What happens inside a semiconductor during deivce operations? Usually, destructive measurements are required to analyze the defects. The novel noninvasive optical characterization techniques provided by our lab can visualize the defect inside an operating device. The techniques show promise for screening the device failure.
News
News
Research
Research
ZnO NRs
ZnO NRs
Zinc oxide nanorods based sensing device
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LED
LED
Destruction of AlGaN LED in brine mist & sea water mist
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