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Conference
Asia-Pacific Productivity Conference (APPC) 2010
Electrical Uniformity Mapping of Carbon Nanotube Thin-Films using Non-invasive Surface Contact Probing Technique
Eunsuk Choi, Chaehyun Lim, Kunhak Lee, Ahsung Lim, Jinoh Kim, and Seung-Beck Lee
Asia-Pacific Productivity Conference (APPC) 2010 Nobember 16, 2010 Shanghai, China