Conference

Asia-Pacific Productivity Conference (APPC) 2010

Electrical Uniformity Mapping of Carbon Nanotube Thin-Films using Non-invasive Surface Contact Probing Technique

Eunsuk Choi, Chaehyun Lim, Kunhak Lee, Ahsung Lim, Jinoh Kim, and Seung-Beck Lee

Asia-Pacific Productivity Conference (APPC) 2010 Nobember 16, 2010 Shanghai, China