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30th International Conference on the Physics of Semiconductors (ICPS) 2010
Bottom gate effect for 3D stackable Polycrystalline silicon channel Charge Trap Flash Memory
Seulki Oh, Joonhyuk Lee, Seonjoon Choi and Seung-Beck Lee
30th International Conference on the Physics of Semiconductors (ICPS) 2010, July 27,2010, Seoul, Korea