Reduced distribution of threshold voltage shift in double layer NiSi2 nanocrystals for nano-floating gate memory applications 

Sung-Jin Choi, Jun-Hyuk Lee, Dong-Hyoun Kim,Seul-ki Oh, WangyuSong, Seon-Jun Choi, Seung-Beck Lee

3rd International Nanoelectronics Conference (INEC) 2010, Jan 5, 2010, City University of Hong Kong, Hong Kong, China