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Conference
Conference
ICM (International Conference on Magnetism) 2012
Nanoscale ion beam etching process for reducing damage and leakage path of magnetic tunnel junction
Daehong Kim, Bongho Kim, Sungwoo Chun, Hyungyu Lee, Seonjun Choi, and Seung-beck Lee,
ICM 2012, July 12, 2012, Bexco, Busan, Korea