Sample Preparation and Characterization
Deposition of 2D materials using the mechanical exfoliation
Synthesis of single crystals using the modified Bridgman technique
Deposition of thin films by DC and RF magnetron sputtering, pulsed laser deposition and chemical solution deposition
Preparation of oxide compounds by solid-state reaction method
Synthesizing the nanoparticles using the sol-gel/hydrothermal method
Photo lithography for making the metal contacts
Characterization of materials by XRD, FESEM, UV-VIS-NIR and Photoluminescence photo spectrometers, Raman and AFM techniques.
Measurement Techniques
Electrochemical workstation for studying the electrochemical chemical properties of the electrodes and catalysts for energy storage devices and hydrogen evolution applications.
Measurement of magnetic properties by MPMS SQUID magnetometer
Measurement of low temperature electrical transport properties like resistivity and magnetoresistance and electroresistance in thin films, and polycrystalline samples using closed cycle refrigerator (CCR) and Physical Property measurements System (PPMS)
Multiferroic tester for ferroelectric (P-E) loops
Semiconductor characterization system (Keithley-4200) for study the device properties of I-V, C-V characteristics, resistive switching/Memristor studies etc.
Electron spin resonance
Hall effect
Use and upkeep of high and ultra-high vacuum systems and cryogenic systems.
Experience in making devices and characterizations
 Resistive random access memory application- Resistive switching/Memristor using the ZnO thin film
Software Skills
Data processing and analysis using Origin program
Full Prof - Rietveld refinement for x-ray diffraction data
PDXL2 software for analyzing the x-ray diffraction data
WSXM software for analyzing the AFM data
Python programming