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The Multidimensional Integration and Testing Lab (MIT Lab) at the Eastern Institute of Technology, Ningbo is an experimental research group working on emerging semiconductor devices, multidimensional integration, and advanced device testing. Our research combines device fabrication, electrical characterization, materials analysis, and integration strategies to study and develop electronic devices for future computing and sensing applications. The group brings together ideas from electrical engineering, materials science, applied physics, and micro/nanofabrication. We welcome motivated students and postdoctoral researchers who enjoy hands-on experimental work, careful analysis, and collaborative research.
Dr. Saravanan Yuvaraja is an Assistant Professor, Principal Investigator, and Doctoral Supervisor at the Eastern Institute of Technology, Ningbo, where he directs the MIT Lab — Multidimensional Integration and Testing Lab. His research focuses on emerging semiconductor devices, multidimensional integration, thin-film electronics, hybrid CMOS circuits, large-area electronics, and device testing. His work has appeared in leading journals including Nature Electronics, Chemical Society Reviews, Materials Horizons, ACS Applied Materials & Interfaces, and Advanced Functional Materials. He is also an inventor on multiple patents related to thin-film transistor devices, sensors, and integrated circuits. At MIT Lab, students and postdoctoral researchers will find a research environment focused on device innovation, advanced characterization, reliable integration, and future electronic systems.
Journal Covers
Three-dimensional integrated hybrid complementary circuits for large-area electronics
Three-dimensional integrated metal-oxide transistors
Organic field-effect transistor-based flexible sensors
Enhancement-Mode Ambipolar Thin-Film Transistors
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