Meenakshi M. Postdoctoral Researcher, Faculty of Mechanical Engineering Delft center of System and Control,
Delft University of Technology, Netherlands
Interdisciplinary applied researcher with expertise in computer vision, pattern recognition, interpretable machine learning, and high-dimensional imaging data analysis. I specialize in developing computational methods for pattern recognition, dimensionality reduction, feature extraction, and explainability in complex datasets such as high-dimensional imaging datasets and Imaging Mass Spectrometry (IMS). My research experience includes statistical machine learning, facial recognition, dimension reduction, deep learning frameworks, signal processing, and spectral omics, reflects a strong foundation in both theoretical model development and applied research.
My scientific interests focus on developing tools to improve machine learning explainability, customize data interpretation, pattern recognition, application-domain-aware dimension reduction, and feature extraction, with applications in biomedical, environmental, and industrial sciences.