Conference
Conference
2026
Junseok Kim and Hwarim Im, "2-clock 신호 기반 멀티 출력 LTPS TFT 스캔 드라이버 회로 설계," 2nd Korean Meeting on Information Display (KMiD 2026), Gangneung, Korea, January 2026 (Poster) (Best Poster Award)
2025
Hwarim Im, "Micro-LED Pixel Circuits Employing Multi-Level Digital PWM," The 25th International Meeting on Information Display 2025 (IMID 2025), Busan, Korea, August 2025 (Oral)
Tae-Hee Jung, Hwarim Im, Jae-Hong Jeon, Kook Chul Moon, and Yong-Sang Kim, "Influence of 1,6-Bis(Trichlorosilyl) Hexane on Amorphous IGZO TFTs," The 25th International Meeting on Information Display 2025 (IMID 2025), Busan, Korea, August 2025 (Poster)
Seol A Park, Hwarim Im, Kook Chul Moon, and Yong-Sang Kim, "Improvement of Mobility and Stability of Solution-Processed IGZO TFTs by Using Fluoride Precursor," The 25th International Meeting on Information Display 2025 (IMID 2025), Busan, Korea, August 2025 (Poster)
Su Hyeon Chae, Hwarim Im, Kook Chul Moon, and Yong-Sang Kim, "Analysis of Y Doping Induced Positive VTH Shift in Solution-Processed IGZO TFTs," The 25th International Meeting on Information Display 2025 (IMID 2025), Busan, Korea, August 2025 (Poster)
Hye-Won Woo, Hwarim Im, Kook Chul Moon, and Yong-Sang Kim, "LTPS TFT-Based Scan Driver Circuit with Stable Dual Polarity Outputs by Bootstrapping without Pre-Charging," SID Display Week 2025, San Jose, USA, May 2025 (Poster)
Sung Wook Lim, Kook Chul Moon, Hwarim Im, and Yong-Sang Kim, "A Novel 5T2C LTPO Pixel Circuit for Micro-LED Display with Simultaneous Compensation and Programming," SID Display Week 2025, San Jose, USA, May 2025 (Poster)
Shin-Hyeong Kim, Hwarim Im, Kook Chul Moon, and Yong-Sang Kim, "소비전력 저감을 위한 LTPS TFT 기반 다중 출력 스캔 드라이버 회로," 1st Korean Meeting on Information Display (KMiD 2025), Gangneung, Korea, January 2025 (Poster)
2024
Hwarim Im, Eun Kyo Jung, Shin-Hyeong Kim, Kook Chul Moon, and Yong-Sang Kim, "Oxide TFT-Based Scan Driver Circuit with Multiple Output Signals using Blocking Structure," The 31st International Display Workshops (IDW 2024), Sapporo, Japan, December 2024 (Oral)
Hwarim Im and Yong-Sang Kim, "Active Layer Thickness-Dependent Reliability of Solution-Processed Indium-Gallium-Zinc Oxide Thin-Film Transistors Under Bias Stress," The Pacific Rim international meeting of The Electrochemical Society (ECS PRiME 2024), Honolulu, HI, USA, October 2024 (Oral)