Publications

journals & magazines

· Khoder K., Kaja K., Choumane A., Boksmati S., Amoud H. (2020) “The Performance of RFID Tags in Close Proximity to Human Body”. In: Bouhlel M., Rovetta S. (eds) Proceedings of the 8th International Conference on Sciences of Electronics, Technologies of Information and Telecommunications (SETIT’18), Vol.2. SETIT 2018. Smart Innovation, Systems and Technologies, vol 147. Springer, Cham
· K. Kaja, P. DeWolf, “Graphene Research with Atomic Force Microscopy: exploring graphene, two- and low- dimensional materials”, Bruker Application note, 2016.
· K. Kaja, P. DeWolf, “Advances in AFM Nano-electrical modes”, Microscopy and Analysis Supplements, March 2016.
· K. Kaja, “AFM Nano-electrical Characterization: new advances in quantification, resolution and multimodal analysis”, Bruker Application note DOI: 10.13140/RG.2.1.2956.6568/1, 2015.
· K. Kaja, N. Chevalier, D. Mariolle, F. Bertin, G. Feuillet, A. Chabli, “Effects of Experimental Parameters on the Work Function Measurement: A Kelvin Force Microscopy Study”, AIP Conf. Proc., 1173, pp. 224-228, Frontiers of Characterization and Metrology for Nanoelectronics, 2009.
· P. Payamyar, K. Kaja, C. R. Vargas, A. Stemmer, et al. “Synthesis of a Covalent Monolayer Sheet by Photochemical Anthracene Dimerization at the Air/Water Interface and its Mechanical Characterization by AFM Indentation”, Advanced Materials, DOI: 10.1002/adma.201304705, 2014 - impact factor 25.8
· D. Mariolle, K. Kaja, F. Bertin, E. Martinez, F. Martin, and R. Gassilloud, “Protocol Optimization For Work-Function Measurements Of Metal Gates Using Kelvin Force Microscopy”, AIP Conf. Proc., 931, pp. 521-524, Frontiers of Characterization and Metrology for Nanoelectronics, 2007.
· O. Renault, A.M. Pascon, H. Rotella, K. Kaja, C. Mathieu, N. Barrett, J. Rault, P. Blaise, T. Poiroux and L. Fonseca, “Charge spill-out and work function of few-layer graphene on SiC(0 0 0 1)”, Journal of Physics D: Applied Physics 47 (29), 295303, 2014 – impact factor 2.829
· B. Canut, A. Ayari, K. Kaja, A.-L. Deman, M. Lemiti, A. Fave, A. Souifi and S. Ramos, “Ion-induced tracks in amorphous Si3N4 films”, Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 266, Issues 12-13, 2008 - impact factor 1.21
· D. Rouchon, L. Becerra, O. Renault, K. Kaja, D. Mariolle, and N. Chevalier, “Raman Spectra and Imaging of Graphene Layers Grown by SiC Sublimation”, AIP Conf. Proc. 1267, pp. 445-446, 2010.
· M. Charbonnier, C. Leroux, V. Cosnier, P. Besson, E. Martinez, N. Benedetto, C. Licitra, N. Rochat, C. Gaumer, K. Kaja, G. Ghibaudo, F. Martin, G. Reimbold, “Measurement of Dipoles/Roll-Off /Work functions by coupling CV and IPE and study of their dependence on fabrication process”, IEEE, TED 57, pp. 1809, 2010 - impact factor 2.7
· K. Kaja, A. Dulebo, P. DeWolf, “ Atomic Force Microscopy: a cross-disciplines tool for the investigation of local properties”, in preparation
· K. Kaja, P. DeWolf, “Sub-surface Nano Dielectric Mapping in Peak Force Kelvin Probe Microscopy”, in preparation.

oral presentations

· Khoder, K., Kaja, K., Choumane, A., Boksmati, S., & Amoud, H. “The Performance of RFID Tag in Close Proximity To Human Body”, SETIT’18, hemmamet – Tunisia, Genoa- Italy, 18-20 Dec 2018.
· K. Kaja, “Atomic Force Microscopy: principles, applications and perspectives”, Journée des Doctorants, Lebanese University, Faculty of Sciences III, September 2017, Lebanon
· K. Kaja, “ Exploring the Nano-mechanical properties on low- and 2D materials using Atomic Force Microscopy”, Materials Technology Workshop, Beirut Arab University, March 2017, Beirut, Lebanon.
· K. Kaja, “ New Horizons in nano-mechanical, nano-electrical and nano-chemical properties of matter”, Nanotechnology Day, Beirut Arab University, March 2017, Tripoli, Lebanon
· K. Kaja, “Latest Advances in Atomic Force Microscopy”, Beirut Arab University, Doctoral school Talks, March 2017, Beirut, Lebanon.
· K. Kaja, “Correlated Electrical, Mechanical and Chemical characterization AFM methods”, NanoteC16, Trinity College Dublin, Ireland, 2016.
· K. Kaja, “Peak Force Tapping: correlating mechanical and electrical properties with accurate force control”, Scanning Probe Microscopy Meeting – Royal Microscopical Society, University of Warwick, United Kingdom, 2016.
· B. H. Smith, T. L. See, F. Hiersemenzel, K. Kaja, M. Antar, “Laser Polishing of Additive Manufactured Steel and Titanium Components”, American Society for Precision Engineering, Summer Topical Meeting -Dimensional Accuracy and Surface Finish in Additive Manufacturing, Raleigh, USA, 2016.
· K. Kaja, N. Chevalier, D. Mariolle, F. Bertin and G. Feuillet, “Etude des effets des paramètres expérimentaux sur la mesure de travail de sortie par KFM“, Forum de microscopie à sonde locale, Hardelot, France, 2009.
· O. Renault, K. Kaja, N. Chevalier, D. Mariolle and F. Bertin, ”Etude spectromicroscopique par XPEEM de surface de graphene/SiC” , ELSPEC, Maroc, 2010.
· D. Rouchon, L. Becerra, O. Renault, K. Kaja, D. Mariolle, N. Chevalier, “Raman spectra and imaging of graphene layers grown by SiC sublimation“, XXII International Conference on Raman Spectroscopy, Boston-Massachusetts, August 2010.
· O. Renault, M. Lavayssière, K. Kaja, A. Bailly, L.-F. Zagonel, and N. Barrett “Recent progress in high-resolution XPS and UPS imaging and nanospectroscopy using XPEEM”, ECASIA, Turkey, 2009.
· K. Kaja, O. Renault, M. Lavayssiere, N. Chevalier, D. Mariolle, D. Rouchon, L. Beccera, T. Poiroux, F. Bertin and G. Feuillet, “Local work function investigation of Graphene on SiC by complementary use of KFM and XPEEM“, ACSIN 10th international conference, Granda, Spain, 2009.
· K. Kaja, O. Renault, M. Lavayssière, D. Mariolle, N. Chevalier, T. Poiroux and F. Bertin, “Local work function investigations of Graphene/SiC by complementary use of KFM and XPEEM: electrical and chemical correlations”, ECASIA, 13th European conference, Antalya, Turkey, October 2009.
· K. Kaja, N. Chevalier, D. Mariolle and F. Bertin, “Study of the experimental effects on the work function measurements using KFM”, Forum des microscopies à sonde locale, France, 2007.

conference posters

· H. Beyer, C. Ruiz-Vargas, K. Kaja, P. Payamyar, M.J. Kory, A.D. Schlüter, A. Stemmer, “Atomic Force Microscopy of two-dimensional monomer and polymer films”, International Symposium on Synthetic Two-Dimensional Polymers, Zurich, Switzerland, 2014.
· P. Payamyar, K. Kaja, L. Opilik, A. Stemmer, R. Zenobi, C. Johnson, D. J. Murray, B. T. King, J. Sakamoto, A. D. Schlüter, “Langmuir Monolayers, A Prototype For Synthesis Of Large Scale 2D Polymers’’, PolyColl 2014 Annual Meeting of the Division of Polymers, Colloids and Interfaces, June 2014, EMPA Dübendorf, Switzerland, Poster Presentation.
· P. Payamyar, K. Kaja, L. Opilik, A. Stemmer, R. Zenobi, C. Johnson, D. J. Murray, B. T. King, J. Sakamoto, A. D. Schlüter, “A Covalently Bonded Monolayer: Synthesis, Mechanistic Insights and Mechanical Characterization”, Gordon Research Conference, Mount Holyoke College, June 2013, South Hadley MA, United StatesPoster Presentation.
· P. Payamyar, K. Kaja, A. Stemmer, J. Sakamoto, A. D. Schlüter, “Preparation and Mechanical Characterization of a Free-Standing Monolayer Made by Anthracene Photo-Dimerization at the Air/Water Interface”, Frontiers in Polymer Science, May 2013, Sitges, Barcelona, Spain, Poster Presentation.
· P. Payamyar, K. Kaja, A. Stemmer, J. Sakamoto, D. Schlüter, “A free-standing, covalently-bonded monolayer: Preparation and mechanical characterization” FMC, Freiburg, Germany, 2013. (BEST POSTER AWARD)
· T. Wagner, J. Tian, K. Kaja and A. Stemmer, “Imaging source-drain potential in arrays of linked gold nanoparticles”, ElecMol 12, Grenoble, France 2012. (BEST POSTER AWARD)
· K Kaja, N Chevalier, D Mariolle, G Feuillet, F Bertin, A Chabli, “Work function measurements in Kelvin force microscopy: Analytical understandings of experimental parameters effects”, FCMN, NIST, Albany USA, 2009.

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