Kratos 165 Ultra

The Kratos 165 Ultra Photoelectron Spectrometer at EPSILON can perform a diverse array of commercial and custom capabilities for film growth and analysis.

Capabilities

• Mg and Al X-Ray excitation, with a high sensitivity Al monochromatic source

• SPECS 10/35 high-intensity UV source (He-I and He-II) for low energy valence band studies of solids

• An intensified microchannel plate/Delay Line detector for increased count rates with up to 127 individual counting channels, allowing for both spectral and imaging measurements using the same detector for X-Ray source powers up to 300 W

• A unique magnetic and electrostatic lens combination in conjunction with a separate mirror analyzer to effect real time chemical state imaging with spatial resolutions as low as 100 microns

• Sputter depth profiling and fast introduction into the ultra high vacuum environment

• Computer-based control interface running an X-win Unix emulation to run the Kratos Vision2 suite of Acquisition and data analysis capabilities

• Recently upgraded interface and peripheries, including a glovebox interface