About

EPSILON@UA is a national user facility that provides a unique state of the art surface characterization by photoelectron spectroscopy. The facility offers a combination of state-of-the-art valence and core-level characterization capabilities together with unique imaging spectroscopies. EPSILON@UA is equipped with X-ray Photoemission Spectroscopy (XPS), Ultraviolet Photoemission Spectroscopy (UPS), Inverse Photoemission Spectroscopy (IPES), energy-filtered Photoelectron Emission Microscopy (PEEM), and spatially-resolved Angle-Resolved Photoemission Spectroscopy (μARPES) and spatially-resolved X-ray Photoemission Spectroscopy.

Photoemission spectroscopy is a powerful tool to characterize the electronic structure and chemical composition of materials. When irradiating a sample with extreme UV or x-ray photons, electrons are emitted from the sample that are characteristic of the material composition and its electronic structure. One may access chemical bonding, work function, band structure, valence electronic levels (both occupied and unoccupied), both area averaged as well as spatially resolved.

The unique capabilities of EPSILON@UA offer an opportunity for users to quantify and measure the chemical composition, the electronic structure and the band structure of thin films, interfaces and solids, with spatial resolution down to approximately 100 nm and temperatures from 30 K to 1000 K. In addition, there is a variety of sample preparation capabilities, including a connected glove box, evaporators, and depth-profiling.

For high-sensitivity area-integrated photoemission spectroscopy, both core and valence levels, we recommend users to consider the Kratos system. For ultra-high resolution spectroscopy, band structure mapping, momentum mapping and chemical imaging, please visit the NanoESCA pages.

Please contact us for discussion of our capabilities and your planned experiments.

Page updated

Google Sites

Report abuse