Advanced Materials Characterization Lab

Electron Microscope Facility Booking

Lab PI: Dr. Jessie Shiue
Contact: 02- 2787-3228. Emails are preferred. 請盡量使用email 作為聯絡方式.

For SEM: Ms. Huang 黃櫻芬 huangyf@gate.sinica.edu.tw
For AC-TEM: Ms. Chen 陳怡蕙 ihchen@gate.sinica.edu.tw

Application forms: For Academia Sinica Users only * Users must be present during SEM or TEM operation sessions.

FE-SEM application form (Thermo Fisher Phenom Pharos)
AC-TEM application form (JEOL JEM-ARM300F2)

Note: The AC-TEM application will be reviewed by a scientific committee to assess whether the scientific merit of the research project and the quality of the TEM specimens are suitable for AC-TEM usage. The committee reserves the right to decline applications that do not meet the necessary criteria.

Acknowledgement: This lab is primarily supported by the Institute of Atomic and Molecular Sciences (IAMS), Academia Sinica. Users are strongly encouraged to add the following statement into the acknowledgments section of their publications: "Technical support from the Advanced Materials Characterization Lab, Institute of Atomic & Molecular Sciences (IAMS), Academia Sinica, is gratefully acknowledged."

Photos taken from the 2021 IAMS Newsletter, pp. 21.

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