Patents
1. Parama Pal, Earu Banoth, “Method for automating the detection of the contours of features on any arbitrary surface using structured illumination ”, CTO1-Parent, IDF-1391083-004, (2019).
1. Parama Pal, Earu Banoth, “Method for automating the detection of the contours of features on any arbitrary surface using structured illumination ”, CTO1-Parent, IDF-1391083-004, (2019).