MidTermExam-II

Mid Term Exam - II

  • Date of Exam 25 March 2014
  • Timings 15:30 -16:30
  • Venue LT-26
  • Exam Syllabus
          • Wafer Characterization
          • Electrical Measurements [ Hot Probe Measurement, Four Probe, Van der Pauw Measurement, Hall Effect measurements]
          • Physical & Chemical Measurements [ Defect Etches, FTIR, Electron Microscopy, Electron Beam Techniques, SEM and TEM ]
          • Thin Film Gowth
          • CVD, MBE
          • Ion Implantation
          • Method, Theory, Equipment, Annealing, RTA
  • Question Paper
  • The question paper is attached below
  • Solutions
  • The detailed solution and marking scheme is attached below.