The Schedule

8:00 am - 8:05 am Opening Remarks

Alexei Skurikhin, Los Alamos National Laboratory, USA

8:05 am - 8:40 am Invited Talk:  Exploring the Atomic World: Advancing Electronic Microscopy with Deep Learning and Generative Models

Dr. Chia-Hao Lee, Cornell University, USA

8:40 am - 10:15 am Oral Presentations (also presented during the poster session):

• Neural Object Detection for 4D-STEM: High-Throughput Sub-Pixel Electron Diffraction Pattern Recognition 

Arda Genc and Ravit Silverstein 

• Improving Multislice Electron Ptychography with a Generative Prior 

Christian Belardi, Chiao-Hao Lee, Yingheng Wang, Justin Lovelace, Kilian Weinberger, David Muller, and Carla Gomes

• Unlocking quantitative insights in EELS-based hyperspectral imaging with physics-driven non-negative matrix factorization 

Pau Torruella Besa, Barbora Bártová, Katharina Reinhold, Thomas LaGrange, Zezhen Pan, Gregory Leinders, Duncan T.L. Alexander, Rizlan Bernier-Latmani, and Cécile Hébert 

• Automated Feature Tracking for Real-Time Kinematic Analysis and Shape Estimation of Carbon Nanotube Growth 

Kaveh Safavigerdini, Ramakrishna Surya, Jaired Collins, Prasad Calyam, Filiz Bunyak, Matthew R. Maschmann, and Kannappan Palaniappan 

• MatSSL: Robust Self-Supervised Representation Learning for Metallographic Image Segmentation 

Hoang Hai Nam Nguyen, Nguyen Duc Hieu Phan, and Ho Won Lee 

• Morphological Analysis of Semiconductor Microstructures using Skeleton Graphs 

Noriko Nitta, Rei Miyata, and Naoto Oishi 

10:15 am - 10:30 am Coffee break

10:30 am - 11:05 am Invited Talk:  Generative AI for Materials Microstructures: from Generation to Inverse Design

Dr. Xiaoyang Zheng, The University of Tokyo, Japan

11:05 am - 11:55 am Spotlight Presentations (also presented during the poster session):

• Unveiling Process–Structure Mapping with a Deep Variational Autoencoder 

Avanish Mishra, Brenden Hamilton, Mashroor Nitol, Nithin Mathew, Kipton Barros, Timothy Germann, and Saryu Fensin

• SAM- and μSAM- Based Inference of Nuclear Materials Processing History from SEM Imagery 

Mayolo Valencia Mendoza, Alexei Skurikhin, Judith Cohn, Luther McDonald IV, Kari Sentz 

• AtomDiffuser: Time-Aware Degradation Modeling for Drift and Beam Damage in STEM Imaging 

Hao Wang, Hongkui Zheng, Kai He, Abolfazl Razi 

• Application of Semantic Segmentation on SEM Images of Rubber Composites and Verification of Correlation with Material Properties 

Ryuta Asami,  Akira Kobayashi, Hiroki Iwana, Taichi Tokunaga, Yosuke Motohashi, Sho Sakamoto, Wakana Miyoshi, and Kentaro Oishi 

• AI-Driven Analysis of Fracture Types in Metallic Materials: Classification, Segmentation, and Quantification with Deep Neural Networks 

Anna Wójcicka, Mateusz Wojtulewicz, Andrzej Brodzicki, Magda Leonkiewicz, Patryk Maciejewski, Joanna Jaworek-Korjakowska, and Krzysztof Mroczka 

• Improving U-Net Confidence on TEM Image Data with L2-Regularization, Transfer Learning, and Deep Fine-Tuning 

Aiden Ochoa, Xinyuan Xu, and Xing Wang 

• A Transformer-Based GAN Architecture for Simulating Carbon Nanotube Structures in the Frequency Domain 

Trevor Bohl, Minasadat Attari, Matthew Maschmann, and Filiz Bunyak 

12:00 pm - 12:30 pm Poster Session:  Exhibit Hall II, Assigned boards 21-33.