Research

Our latest work titled "Achieving sub-0.5-angstrom–resolution ptychography in an uncorrected electron microscope" has been published on Science!

This work demonstrates for the first time, microscopists can now achieve state-of-the-art spatial resolution on a non-aberration corrected electron microscope using electron ptychography. This should greatly expand the capability of most facilities that cannot afford a multi-million-dollar aberration-corrected microscope and lower the entry barrier of materials science research at atomic-scale.

This work has also been reported by EurekaAlert! and MRL News.

I've defended my thesis titled "Characterizing the Heterogeneity of 2D Materials with Transmission Electron Microscopy and Machine Learning" on Mar. 31, 2023.

The full defense video (Zoom recording) and the slides are available. Let me know if you have any further questions! 

I’ve been developing advanced scanning electron transmission microscopy techniques with the aid of machine learning to characterize 2D materials and their heterogenity at the atomic scale, such as point defects, phase boundaries, and twisted moire structures throughout my PhD at UIUC. 

Recently I’m working on this rising 4D-STEM technique: deep sub-angstrom electron ptychography while considering dynamical scattering and atomic vibration. 

Prior to my PhD study, I was a Master’s research assistant in the group of Prof. Cheng-Yen Wen at the Department of Materials Science and Engineering in National Taiwan University (NTU). 

For my Master’s thesis, I designed and built an ultra-high vacuum CVD system so that I can synthesize graphene on nickel silicide substrate without interface oxidation. I’ve also been employed as a TEM teaching assistant for new user training and assisted operations by the MSE department throughout my Master’s study (2012-2014) in NTU.