The pulse tester is designed to study the changes that occur in a non-stationary signal as it passes through an electronic device under test.
Testing is performed by generating a single pulse, recording the original pulse shape on one channel, recording the modified pulse shape on another channel, and then comparing the shapes of the original and tested signals. This procedure allows you to: see what waveform the device under test introduces into the passing signal, obtain a quantitative estimate of the pulse phase shift after passing through the circuit under test, see and evaluate the distortions that the general feedback returns to the input of the low-frequency amplifier.
Select the appropriate type of pulse. Record the initial pulse on the first channel, and the pulse being studied on the repeat channel.