Research Interests (Summary)

Conventional and Disruptive VNAND Flash Memory 

Advanced DRAM architecture (2T0C, 1TnC, Stacked DRAM, VCT, HBM Thermal Analysis )

Logic Device and Reliability (CFET, SRAM, R-O, Self-Heating, Radiation, HCI/BTI)

Ferroelectric, 2D, I-G-Z-O material applied Field Effect Transistors

Power Devices (LDMOS - SHE, GaN)

RF CMOS Modeling (Noise Parameter, Channel Thermal Noise)

SPICE, BSIM, TCAD-Sentaurus, Process Integration with sProcess