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In this section, you’ll find an overview of the tools and facilities we use in our daily research activities. From low-temperature electrical measurements to optical setups for photodetection, our equipment enables high-precision experiments in the field of condensed matter physics and nanotechnology.
In this section, you’ll find an overview of the tools and facilities we use in our daily research activities. From low-temperature electrical measurements to optical setups for photodetection, our equipment enables high-precision experiments in the field of condensed matter physics and nanotechnology.
Whether you're a collaborator, a prospective student, or simply curious, feel free to explore the technologies that power our scientific discoveries.
Whether you're a collaborator, a prospective student, or simply curious, feel free to explore the technologies that power our scientific discoveries.
The Lab Equipment
At the ELENA Lab, we use a versatile suite of state-of-the-art instruments to fabricate, explore, and characterize advanced electronic, optoelectronic, and nanostructured devices, with a special focus on two-dimensional materials and their heterostructures. Our equipment enables electrical, optical, and surface analysis under a wide range of experimental conditions.
Surface analysis
Nanosurf NaioAFM Atomic Force Microscope
All-in-one, compact AFM for nano-scale surface analysis.
Scan range: 70 µm × 70 µm; vertical range: 14 µm.
Z-noise: 0.4 nm (static), 0.3 nm (dynamic).
Supports static and dynamic modes, phase contrast, MFM, EFM.
Spectroscopy modes: force–distance, amplitude–distance, voltage–distance.
Optional advanced modes: current–voltage, force modulation, lithography.
Leica DM4 B / DM6 B Upright Microscope
Research-grade upright optical microscope with automated or manual configurations.
LED or halogen illumination.
Automated contrast switching (brightfield, darkfield, phase contrast, DIC, fluorescence).
Automated Köhler illumination.
LAS X software with Navigator for rapid sample overview.
Motorized version (DM6 B) adds autofocus, Z-stacking, and high-throughput imaging.
Electrical Characterization
Keithley 4200A-SCS Parameter Analyzer
A modular, all-in-one system for advanced semiconductor device and nanostructure characterization, enabling synchronized I-V, C-V, and ultra-fast pulsed I-V measurements.
DC I-V range: 10 aA to 1 A, 0.2 µV to ±210 V.
Multi-frequency C-V: 1 kHz to 10 MHz, DC bias ±30 V (expandable to ±210 V).
Pulsed I-V: ±40 V (80 V p-p), ±800 mA, up to 200 MS/s, 5 ns resolution.
Supports up to 9 SMUs, plus optional CVU, PMU, switch matrices, and remote preamps (down to 10 aA).
Janis Cryogenic Probe Station
High-precision cryogenic probing system for electrical and optoelectronic measurements at low temperature.
Temperature range: 4 K to 475 K (depending on configuration).
High vacuum or controlled atmosphere operation.
Integrated stereo microscope for probe alignment.
Multiple arms for tungsten or other conductive tips.
Compatible with SMUs and parameter analyzers for I-V, C-V, resistance, noise, and high-frequency measurements.
Lake Shore Cryogenic Probe Station
High-performance cryogenic probe stations for electrical, magneto-transport, and optoelectronic testing.
Temperature range: 1.6 K (He-3) or 4.2 K (He-4) up to 475 K.
High vacuum or controlled atmosphere.
DC, RF, and optoelectronic measurement capability.
Optional superconducting magnets for fields up to several tesla.
Precision micromanipulators and modular configuration for lasers, in-situ illumination, and high-resolution cameras.
Optoelectronical Characterization
NKT Photonics SuperK COMPACT supercontinuum source laser
Compact broadband white-light laser with output from 450 to 2400 nm via single-mode fiber and collimated beam.
Total power > 110 mW; visible (450–850 nm) > 20 mW.
Repetition rate: 1 Hz to 20 kHz; pulse width < 2 ns; jitter < 2 µs.
Gaussian beam, TEM₀₀, M² < 1.1.
Robust fiber design for 24/7 operation (> 10,000 h lifetime).
USB control and external trigger capability.
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