Facilities

Scanning Near-field Optical Microscope (SNOM) allows hyper-spectral imaging of different optical signals (photoluminescence, resonant scattering, reflection, transmission) with deep-subwavelength spatial resolution.

The SNOM is equipped with sources and detectors in the visible and near-infrared.

The setup is also combined with a Confocal Microscope and a Dark-Field Microscope.

Currently this setup is exploited for the investigation of ordered and disordered dielectric systems, as photonic crystal cavities, silicon ring resonators, dielectric Mie scatters and hyperuniform geometries, capable to manipulate and confine light at the nanoscale.

The micro-PL setup consists in a custom confocal microscope equipped with a low-vibration continuos He-flow cryostat (8-330 K) which in turn is mounted on x-y translation stages. The excitation wavelengths span the range 400 – 900 nm, while the detection is in the interval 350 – 1600 nm.

The system allows also to perform time-resolved PL measurements (up to 30 ps resolution) and second order autocorrelation measurements (Hanbury-Brown and Twiss setup).