Pubblicazioni

• Rossella Berni; Nedka D. Nikiforova; Federico M. Stefanini (2025). Bayesian Optimal Designs for Reliability. In: In: Statistics for Innovation II / [a cura di] E. di Bella, V. Gioia, C. Lagazio, S. Zaccarin. , pp. 178-183, Switzerland: Springer, ISBN:978-3-031-96303-2., vol. Italian Statistical Society Series on Advances in Statistics. DOI: https://dx.doi.org/10.1007/978-3-031-96303-2.

• Federico M. Stefanini, Nedka D. Nikiforova, Rossella Berni (2025). A Structural Causal Model for Electronic Device Reliability: from Effects to Counterfactuals. arXiv preprint arXiv:2506.18663, pp. 1-23. https://arxiv.org/pdf/2506.18663.