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LIRAM
Home
Members
Facilities
Research
Composites
Bio-inspired Damage-tolerant Materials
Semiconductor Reliability
Publications
Honors and Awards
LIRAM
Home
Members
Facilities
Research
Composites
Bio-inspired Damage-tolerant Materials
Semiconductor Reliability
Publications
Honors and Awards
More
Home
Members
Facilities
Research
Composites
Bio-inspired Damage-tolerant Materials
Semiconductor Reliability
Publications
Honors and Awards
Semiconductor Reliability
Nanoindentation-based Material Characterization
Back-end-of-line and packaging-level material characterization
Solder Creep with Thermal Cycling
Creep.mp4
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