Facilities
Our research group engages in a variety of materials and device fabrication and characterization techniques. We routinely utilize the following University of Delaware core research facilities, as well as several specialized capabilities. We invite inquiries for research collaboration based on these facilities.
Bruker Vertex 80V FTIR Spectrometer
This advanced R&D system has several specialized modules for infrared materials and device characterization. This includes infrared transmittance, reflectance, photoluminescence, and time-resolved photoluminescence. The instrument includes options for step-scan mode, cryogenic measurements (down to liquid nitrogen or liquid helium temperatures), and spectral windows in the near-infrared and mid-infrared regions.
Freiberg Instruments MDpicts Minority Carrier Lifetime Measurement System
This system provides contactless temperature dependent measurement of minority carrier liftime and to measure characteristics of bulk and interface traps. The measurement is based on microwave photoconductive decay (PCD) and microwave photo-induced current transient spectroscopy (PICTS)
SCIENCETECH Quantum Efficiency Measurement System
This system is designed primarily for photovoltaic testing, including current-voltage measurements, spectral response, external and internal quantum efficiency, and photoconductivity. The spectral coverage is 250-2500 nm.