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Low Frequency CV
Low Frequency CV
Model: E4284A(Kesight Technology, 20Hz ~ 1MHz)
Source Measure Units
Source Measure Units
Model: 2612B (Keithley, 2Ch. SMU, 200V, 100fA, 1.5A DC/10A Pulse)
Electron-Beam Lithography
Electron-Beam Lithography
Model: TESCAN & Raith
Semiconductor Analyzer
Semiconductor Analyzer
Model: B1500A (HPSMU#1/HRSMU#1/MPSMU#4/WGFMU#2/CMU+SCUU)
Atomic Force Microscope
Atomic Force Microscope
Model: NX10 (Park System)
Lock-in Amplifier
Lock-in Amplifier
Model: 50 MHz LOCK-IN Amplifier (HF2LI)
Vacuum Probe Station
Vacuum Probe Station
Model: Vacuum Probe Station (VPS) (WIT, VEM-10X)
Low-Frequency Noise Measurement
Low-Frequency Noise Measurement
*Spec.: 20 Hz ~ 20 kHZ, Transistor, Diode, Resistor, OLED etc.
- Simultaneous Optical and Electrical Cross Noise Correlation Factor Measurements
Dry Transfer System
Dry Transfer System
Model: Dry transfer system (WIT< DTS-P200)
Optical Microscope
Optical Microscope
Model: Optical microscope (MIC, S39B SET, - Magnification: 100x, 50x, 20x, 10x)
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