Features

The Quanta 200 FEG uses a field-emission gun (FEG) electron source and can be switched between three vacuum modes enabling the investigation of conductive, non-conductive and high-vacuum incompatible materials. It offers nanometer resolution and a high signal to noise ratio in both regular high vacuum and environmental modes.

The EDS consists of an 80 mm2 SDD detector which enables detection of elements under high resolution.

Performance

• Three vacuum modes - High, Low and ESEM modes

• Samples can be studied in pressures up to 5 Torr

• BSED, ETD, LFD and STEM detector are also incorporated

• The Wet SEM provides imaging at relative humidity conditions up to 100%

• Manual user interface EDS with 80 mm2 SDD detector can be used in three modes: point & ID, analyzer and mapping

• Resolution: 2 nm

Applications

• Surface morphology of all kinds of conductive and non-conductive samples including nano to micro scale structures, films, ceramics etc. can be analyzed

• Texture information by performing phase identification through BSED

• Elemental detection and orientation mapping can be done by EDS

Sample Specifications

• Conductive and non-conductive solid samples can be analyzed

• Non-conductive samples can be analyzed under low vacuum mode or must be sputter coated either with gold, platinum or silver for high vacuum mode

• Gel and liquid samples can also be analyzed using Peltier stage under different conditions

• Height: 1 - 1.5 cm

• Minimum amount required for analysis 

  • 5 mg for powder sample

  • 1X1 cm2 for films

  • 100 µl for liquid sample

Testing Parameters

• Magnification: 50X to approx 200,000X depending on the nature of the sample

• Voltage: 2 kV to 30 kV

• Parameters may vary depending upon the nature of the sample

Points to be noted

• Samples should not be toxic, reactive or volatile in nature

• Sample should be well dispersed and vacuum dried

Location: Ex Hall, Main building, IIT Delhi