Professional Skills

- 6 years of experience as a manager of the surface characterization service lab

- 8 years of experience in battery research

- 14 years of experience in the management and development of laboratories with advanced experimental equipment

 - 24 years of experience with modern surface analytical techniques and materials characterization

 - Hands-on experience in ultra-high-vacuum (UHV) and low-temperature systems, including design

 - Extensive experience in teaching and guiding undergraduate and graduate students

 - Experience working in a clean room and workshop

 - Experience working with SAP, Inventor, MATLAB, Project Manager, LabView

- Proved ability for publication in peer-reviewed journals and conference presentations 

Courses and certifications

- Basis TOF-SIMS training course by IONTOF

- IONTOF Level 2 maintenance certificate

- XPS application training by PHI

-      X-ray Photoelectron Spectroscopy and Data Processing

-     CasaXPS

My Experimental Toolkit

During 24 years of my career, I have established a deep expertise in various techniques that span surface science. I have practical experience and am sufficiently proficient not only to use but also to guide and mentor students and early career researchers in:

•Photon spectroscopies

XPS – X-ray Photoelectron Spectroscopy (a primary technique I used during my Ph.D., and I have experience working on four different systems),

UPS – UV Photoelectron Spectroscopy.

•Mass spectroscopies

TOF-SIMS – Time of Flight Secondary Ion Mass Spectroscopy (primary technique during the last nine years. Have experience on IONTOF and PHI systems);

TPD – Temperature Programmed Desorption,

RGA/SIMS – Residual Gas Analysis (have experience in building an extra-sensitive mass detector for low masses)

•Ion beam techniques

TOF-ISS Time of Flight Ion Scattering Spectroscopy (charge exchange and scattering),

LEIS – Low Energy Ion Scattering.

•Molecular beam techniques

Helium Spin Echo Spectroscopy (the state-of-the-art system which was built and designed under my management),

HAS – Helium Atom Scattering

 seeded and hyperpolarized beams as a probe or as an object.

•Vibrational spectroscopies

HREELS – High-Resolution Electron Energy Loss Spectroscopy

FTIR – Fourier Transform Infrared Spectroscopy.

•Microscopies

STM – Scanning Tunneling Microscopy

AFM – Atomic Force Microscopy

SEM – Secondary Electron Microscopy