Prof. Ga-Won Lee
Ki Wan Kim, Won Gyun Park, Do-Yeon Lee, Ga-Won Lee, Binghao Wang, and Jae-Hyuk Ahn. " In-Situ Vertical-Contact Engineering of Laser-Induced Graphene Nanotips for Ultra-Sensitive Humidity Sensors" Small (2025): 2505017.
Oh Yeon-Wha, Hoon Kim, Lee-Mi Do, Kyu-Ha Baek, Il-Suk Kang, Ga-Won Lee and Chan-mo Kang. "Rapid activation of a solution-processed aluminum oxide gate dielectric through intense pulsed light irradiation." RSC advances 14.50 (2024): 37438-37444.
Do-Yeon Hwang, Hee-Jung Yeom, Gawon Lee*, Jung-Hyung Kim*, and Hyo-Chang Lee*. "Transmission spectrum analysis of ceramic-shielded microwave cutoff probes in low-pressure plasmas". Journal of Applied Physics (2024).
Woon-San Ko, Myeong-Ho Song, Jun-Ho Byun, Do-Yeon Lee, So-Yeon Kwon, Jong-Sin Hyun, Dong-Hyeuk Choi, and Ga-Won Lee*. "Effect of SiCN thin film interlayer for ZnO-based RRAM". Nanotechnology (2024): 065201
So-Yeon Kwon, Woon-San Ko, Jun-Ho Byun, Do-Yeon Lee, Hi-Deok Lee, and Ga-Won Lee*. "The Switching Characteristics in Bilayer ZnO/HfO2 Resistive Random-Access Memory, Depending on the Top Electrode". Electronic Materaterials (2024): 71-79.
Yu-Mi Kim*, Jun Kue Park, Woon-San Ko, Ki-Nam Kim, and Ga-Won Lee. "Characterization of ZnO Thin-film Transistors with Various Active Layer Structures after Exposure to Different Proton Energies" Journal of Semiconductor Technology and Science (2024): 63-68.
Jungchul Song, Gyu-Won Han, Jeonghwan Kim, and Ga-Won Lee*. “19-nm critical dimension process using mask shift double exposure in ArF immersion.” Journal of Micro/Nanopatterning, Materials, and Metrology (2024): 014801-014801.
Do-Yeon Lee, Woon-San Ko, Ki-Nam Kim, Jun-Ho Byun, Eun-Gi Kim, So-Yeon Kwon, and Ga-Won Lee*. “Analysis of metal and zinc oxide semiconductor interface resistance using transmission line method transistors.” Solid-State Electronics (2024): 108916.
Bongmin Jeong, Aesun Oh, Sunae Kim, Gawon Lee, and Hyuncheol Bae*. “Thermal Design of High Power Semiconductor Using Insulated Metal Substrate.” Journal of the Microelectronics and Packaging Society (2023): 63-70.
Ki-Nam Kim, Jun-Ho Byun, Woon-San Ko, Do-Yeon Lee, So-Yeon Kwon, Hi-Deok Lee, and Ga-Won Lee*. "Investigation of Temperature-Dependent Mechanism of TCR in a-Si:H for Microbolometer Applications " IEEE Sensors Jornal (2023).
Jun-Ho Byun, Woon-San Ko, Ki-Nam Kim, Do-Yeon Lee, So-Yeon Kwon, Hi-Deok Lee, and Ga-Won Lee*. "Performance enhancement of HfO2-based resistive random-access memory devices using ZnO nanoparticles." Nanotechnology (2023): 395203.
Woonsan Ko, Jaeyoung Sung, Junkyo Jeong, Jaehyuk Ahn, Hideok Lee, and Gawon Lee*. "Design of auto-store circuit for nvSRAM with SONOS access transistor." Solid-State Electronics (2023): 108588.
Jungchul Song, Jae Sub Oh, Min Jun Bak, Il-Suk Kang, Sung Jung Lee, and Ga-Won Lee*. "300 mm Large Area Wire Grid Polarizers with 50 nm Half-Pitch by ArF Immersion Lithography." Nanomaterials 12.3 (2022): 481.
Jungchul Song, Chae-Hwan Kim, and Ga-Won Lee*. "A Study on the Resolution and Depth of Focus of ArF Immersion Photolithography." Micromachines 13.11 (2022): 1971.
Ki-Nam Kim, Woon-San Ko, Jun-Ho Byun, Do-Yeon Lee, Jun-Kyo Jeong, Hi-Deok Lee, and Ga-Won Lee*. "Bottom-Gated ZnO TFT Pressure Sensor with 1D Nanorods." Sensors 22.22 (2022): 8907.
Myeong-Ho Song, Woon-San Ko, Geun-Ho Kim, Dong-Hyeuk Choi, and Ga-Won Lee*. "Studies on Oxygen Permeation Resistance of SiCN Thin Film and RRAM Applications." Nanomaterials 12.23 (2022): 4342.
Jun-Kyo Jeong, Jae-Young Sung, Woon-San Ko, Ki-Ryung Nam, Hi-Deok Lee, and Ga-Won Lee*. "Physical and Electrical Analysis of Poly-Si Channel Effect on SONOS Flash Memory." Micromachines 12.11 (2021): 1401.
Jae-Young Sung, Jun-Kyo Jeong, Woon-San Ko, Jun-Ho Byun, Hi-Deok Lee, and Ga-Won Lee*. "High Pressure Deuterium Passivation of Charge Trapping Layer for Nonvolatile Memory Applications." Micromachines 12.11 (2021): 1316.
Yumin Song, Jun-Kyo Jeong, Seung-Dong Yang, Deok-Min Park, Yun-mi Kang, and Ga-Won Lee*. "Process effect analysis on nitride trap distribution in silicon-oxide-nitride-oxide-silicon flash memory based on charge retention model." Materials Express 11.9 (2021): 1615-1618.
Jae-Young Sung, Jun-kyo Jeong, Ki-Ryung Nam, and Ga-Won Lee*. "Extraction of Effective Charge Diffusivity in the Charge Trapping Layer of SONOS Flash Memory." Transactions on Electrical and Electronic Materials 22.4 (2021): 432-438.
Ki-Ryung Nam, Jun-Kyo Jeong, Jae-Young Sung, and Ga-Won Lee*. "Modeling and Verification of Interface and Bulk Trap Level Density Extraction in SONOS Memory Charge Trapping Layer." Transactions on Electrical and Electronic Materials 22.3 (2021): 372-377.
Jun-Kyo Jeong, Jae-Young Sung, Hee-Hoon Yang, Hi-Deok Lee, and Ga-Won Lee*. "Charge Migration Analysis of 3D SONOS NAND Flash Memory Using Test Pattern." JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE 20.2 (2020): 151-157.
Byung-Jun Jeong, Jun-Kyo Jeong, Yu-Min Song, Hi-Deok Lee, Ho-Suk Choi, and Ga-Won Lee*. "Mobility Improvement of Amorphous Indium-gallium-zinc Oxide Thin Film Transistor by Roll-to-roll Compatible Plasma Treatment." JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE 20.2 (2020): 163-169.
Jun-Kyo Jeong, Byeong-Jun Jeong, Jae- Sub Oh, and Ga-Won Lee*. "Downscaling Study of Uncooled a-Si Infrared Microbolometer Cell based on Simulation." JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE 20.1 (2020): 47-54.
Jae Young Sung, Jun Kyo Jeong, and Ga Won Lee*. "Reliability Analysis by Lateral Charge Migration in Charge Trapping Layer of SONOS NAND Flash Memory Devices." Journal of the Semiconductor & Display Technology 18.4 (2019): 138-142.
Yu Min Song, Jun Kyo Jeong, Jae Young Sung, and Ga Won Lee*. "Analysis of Trap Dependence on Charge Trapping Layer Thickness in SONOS Flash Memory Devices Based on Charge Retention Model." Journal of the Semiconductor & Display Technology 18.4 (2019): 134-137.
Hee Hun Yang, Jae Young Sung, Jun Kyo Jeong. "Study on the Activation Energy of Charge Migration for 3D NAND Flash Memory Application." Journal of the Semiconductor & Display Technology 18.2 (2019): 82-86.
Seung-Dong Yang, Jun-Kyo Jung, Jae-Gab Lim, Seong-gye Park, Hi-Deok Lee, and Ga-Won Lee*. "Investigation of intra-nitride charge migration suppression in SONOS flash memory." Micromachines 10.6 (2019): 356.
Hyo-Jun Oh, Reddicherla Umapathi, Oleksii Omelianovych, Van-Duong Dao, Jun-Kyo Jeong, Ga-Won Lee*, and Ho-Suk Choi. "Effect of various seed metals on uniformity of Ag layer formed by atmospheric plasma reduction on polyethylene terephthalate substrate: An application to electromagnetic interference shielding effectiveness." Thin Solid Films 676 (2019): 75-86.
Junkyo Jeong, Byeongjun Jeong, Jaeseop Oh, and Gawon Lee*. "Study on the Temperature Dependency Effect of Thermal Coefficient of Resistance in Amorphous Silicon for Uncooled Microbolometer Application." MRS Advances 4.8 (2019): 447-455.
Yu-Mi Kim, and Ga-Won Lee*. "Effects of Al2O3 gate insulator on the instability of amorphous indium-gallium zinc oxide thin film transistors." AIP Advances (2018).
Yu-Jung Kim, Jun-Kyo Jeong, Jung-Hyun Park, Byung-Jun Jeong, Hi-Deok Lee, and Ga-Won Lee*. "Selective UV–O3 treatment for indium zinc oxide thin film transistors with solution-based multiple active layer." Japanese Journal of Applied Physics 57.6S3 (2018): 06KB01.
Jae-Gab Lim, Seung-Dong Yang, Ho-Jin Yun, Jun-Kyo Jung, Jung-Hyun Park, Chan Lim, Gyu-seok Cho, Seong-gye Park, Chul Huh, Hi-Deok Lee, and Ga-Won Lee*. "High performance SONOS flash memory with in-situ silicon nanocrystals embedded in silicon nitride charge trapping layer." Solid-State Electronics 140 (2018): 134-138.
Jun-Kyo Jeong, Ho-Jin Yun, Seung-Dong Yang, Ki-Yun Eom, Seong-Won Chea, Jeong-Hyun Park, Hi-Deok Lee, and Ga-Won Lee*. "Investigation of atomic-layer-deposited Al-doped ZnO film for AZO/ZnO double-stacked active layer thin-film transistor application." Thin Solid Films 638 (2017): 89-95.
Yu Jung Kim, Jun Kyo Jeong, Jung Hyun Park, Byung Jun Jeong, and Ga Won Lee*. "Study on Electrical Characteristic Improvement of PVP-IZO TFT Prepared by Solution Process Using UV-O 3 Treatment." Journal of the Semiconductor & Display Technology 16.2 (2017): 66-69.
Seong Won Chae, Ho-Jin Yun, Seung-Dong Yang, Jun-Kyo Jeong, Jung-Hyun Park, Yu-Jeong Kim, Hyo-Jin Kim, and Ga Won Lee*. "Investigation of Low-Temperature Processed Amorphous ZnO TFTs Using a Sol-Gel Method." Transactions on Electrical and Electronic Materials 18.3 (2017): 155-158.
Jun-Kyo Jeong, Ho-Jin Yun, Seung-Dong Yang, Jung-Hyun Park, Ho-jin Kim, and Ga-Won Lee*. "Fabrication and Characterization of TFT Gas Sensor with ZnO Nanorods Grown by Hydrothermal Synthesis." Journal of the Korean Institute of Electrical and Electronic Material Engineers 30.4 (2017): 229-234.
Jung Hyun Park, Jun Kyo Jeong, Yu Jeong Kim, Byeong Jun Jung, and Ga Won Lee*. "Electrical Characteristic Analysis of IGZO TFT with Poly (4-vinylphenol) Gate Insulator according to Annealing Temperature." Journal of the Semiconductor & Display Technology 16.1 (2017): 97-101.
Yeon-Wha Oh, Chan-Mo Kang, Jin Hwa Ryu, Hoon Kim, Kyu-Ha Baek, Ga-Won Lee, Sanggeun Lee, Geumseok Seo, Hongdoo Kim, and Lee-Mi Do. "The Bilayer Structure for Low-Temperature, Solution-Processed Indium Zinc Oxide Thin-Film Transistors." Journal of Nanoscience and Nanotechnology 16.8 (2016): 8692-8695.
Jonghee Lee, Woo Jin Sung, Chul Woong Joo, Hyunsu Cho, Namsun, Jonghee Lee, Woo Jin Sung, Chul Woong Joo, Hyunsu Cho, Namsung Cho, Ga-Won Lee, Do-Hoon Hwang, and Jeong-Ik Lee*. "Simplified Bilayer White Phosphorescent Organic Light‐Emitting Diodes." ETRI Journal 38.2 (2016): 260-264.
Seong-Hyeon Kim, Seung-Dong Yang, Jin-Seop Kim, Jun-Kyo Jeong, Hi-Deok Lee, and Ga-Won Lee*. "Charge spreading effect of stored charge on retention characteristics in SONOS NAND Flash memory devices." Transactions on Electrical and Electronic Materials 16.4 (2015): 183-186.
Ki-Yun Eom, Kwang-Seok Jeong, Ho-Jin Yun, Yu-Mi Kim, Seung-Dong Yang, Jin-Seop Kim, and Ga-Won Lee*. "Improvement of Electrical Performance and Stability in ZnO Channel TFTs with Al Doped ZnO Layer." Journal of the Korean Institute of Electrical and Electronic Material Engineers 28.5 (2015): 291-294.
Seung-Dong Yang, Ho-Jin Yun, Yu-mi Kim, Jin-Seob Kim, Ki-Yun Eom, Seong-Won Chea, Hi-Deok Lee, and Ga-Won Lee*. "Analysis of Nitride traps in MONOS Flash Memory." Journal of the Institute of Electronics and Information Engineers 52.8 (2015): 59-63.
Young-Uk Ko, Ho-Jin Yun, Kwang-Seok Jeong, Yu-Mi Kim, Seung-Dong Yang, Seong-Hyeon Kim, Jin-Sup Kim, Jin-Un An, Ki-Yun Eom, and Hi-Deok Lee*. "Enhanced photo current in n-ZnO/p-Si diode via embedded Ag nanoparticles for the solar cell application." JSTS: Journal of Semiconductor Technology and Science 15.1 (2015): 35-40.
Young-Uk Ko, Ho-Jin Yun, Kwang-Seok Jeong, Yu-Mi Kim, Seung-Dong Yang, Seong-Hyeon Kim, Jin-Sup Kim, Jin-Un An, Hi-Deok Lee, and Ga-Won Lee*. "Current–voltage and low-frequency noise analysis of heterojunction diodes with various passivation layers." Thin Solid Films 598 (2016): 109-114.
Jeong, Kwang-Seok, Yu-Mi Kim, and Ga-Won Lee*. "Origin of oxygen-induced abnormal hump in bottom-gated polycrystalline zinc oxide thin film transistors." ECS Journal of Solid State Science and Technology 4.5 (2015): Q31.
Jin Un An, Ho Jin Yun, Kwang Seok Jeong, Yu Mi Kim, Seung Dong Yang, Seong Hyeon Kim, Jin Sup Kim, Young Uk Ko, Hi Deok Lee, and Ga Won Lee*. "Improvement in n-ZnO/p-Si diode properties using ZnO/AZO homogeneous metal contact." Japanese Journal of Applied Physics 53.8S3 (2014): 08NJ03.
Seong-Hyeon Kim, Kwang-Seok Jeong, Ho-Jin Yun, Seung-Dong Yang, Yu-Mi Kim, Jin-Seop Kim, Young-Uk Ko, Jin-Un An, Hi-Deok Lee, and Ga-Won Lee*. "Channel engineering of ZnO-based thin film transistors using Al2O3 interlayer grown by atomic layer deposition." Japanese Journal of Applied Physics 53.9 (2014): 091101.
Kwang Seok Jeong, Hyuk Min Kwon, Hi Deok Lee, and Ga Won Lee*. "Ultra‐thin aluminum oxide as an interface passivation layer for ZnO/p‐Si heterojunction solar cells." physica status solidi (a) 211.8 (2014): 1850-1856.
Ho-Jin Yun, Young-Su Kim, Kwang-Seok Jeong, Yu-Mi Kim, Seung-dong Yang, Hi-Deok Lee, and Ga-Won Lee*. "Analysis of stability improvement in ZnO thin film transistor with dual-gate structure under negative bias stress." Japanese Journal of Applied Physics 53.4S (2014): 04EF11.
Kwang-Seok Jeong, Sung-Kwen Oh, Hong-Sik Shin, Ho-Jin Yun, Seong-Hyeon Kim, Ho-Ryeong Lee, Kyu-Min Han, Ho-Yun Park, Hi-Deok Lee, and Ga-Won Lee*. "Novel silicon surface passivation by Al2O3/ZnO/Al2O3 films deposited by thermal atomic layer deposition." Japanese Journal of Applied Physics 53.4S (2014): 04ER19.
Seung-Dong Yang, Seong-Hyeon Kim, Ho-Jin Yun, Kwang-Seok Jeong, Yu-Mi Kim, Jin-Seop Kim, Young-Uk Ko, Jin-Un An, Hi-Deok Lee, and Ga-Won Lee*. "Analysis of SOHOS flash memory with 3-level charge pumping method." JSTS: Journal of Semiconductor Technology and Science 14.1 (2014): 34-39.
Young Su Kim, Tae Hyun Kim, Gyung Tae Kim, Boo Taek Lim, Seong Kyu Lim, Hi Deok Lee, and Ga Won Lee*. "Uncooled microbolometer arrays with high responsivity using meshed leg structure." IEEE Photonics Technology Letters 25.21 (2013): 2108-2110.
Sang-Youl Lee, Jae-Sub Oh, Seung-Dong Yang, Ho-Jin Yun, Kwang-Seok Jeong, Yu-Mi Kim, Hi-Deok Lee, and Ga-Won Lee*. "Characterization of polycrystalline silicon-oxide-nitride-oxide-silicon devices on a SiO2 or Si3N4 buffer layer." Electronic Materials Letters 9.1 (2013): 23-27.
Yu-Mi Kim, Kwang-Seok Jeong, Ho-Jin Yun, Seung-Dong Yang, Sang-Youl Lee, Hi-Deok Lee, and Ga-Won Lee*. "Investigation of the instability of low-temperature poly-silicon thin film transistors under a negative bias temperature stress." Electronic Materials Letters 9.1 (2013): 13-16.
Sang-Youl Lee, Seung-Dong Yang, Ho-Jin Yun, Kwang-Seok Jeong, Yu-Mi Kim, Seong-Hyeon Kim, Hi-Deok Lee, Ga-Won Lee, and Jae-Sub Oh*. "Pillar Type Silicon-Oxide-Nitride-Oxide-Silicon Flash Memory Cells with Modulated Tunneling Oxide." Transactions on Electrical and Electronic Materials 14.5 (2013): 250-253.
Jae-Sub Oh, Seong-Dong Yang, Sang-Youl Lee, Young-Su Kim, Min-Ho Kang, Sung-Kyu Lim, Hi-Deok Lee, and Ga-Won Lee*. "3D gate-all-around bandgap-engineered SONOS flash memory in vertical silicon pillar with metal gate." Solid-state electronics 86 (2013): 6-10.
Seung-Dong Yang, Jae-Sub Oh, Ho-Jin Yun, Kwang-Seok Jeong, Yu-Mi Kim, Sang Youl Lee, Hi-Deok Lee, and Ga-Won Lee*. "The short channel effect immunity of silicon nanowire SONOS flash memory using TCAD simulation." Transactions on Electrical and Electronic Materials 14.3 (2013): 139-142.
Young Su Kim, Min Ho Kang, Jae Sub Oh, Kang Suk Jeong, Yu Mi Kim, Dong Eun Yoo, Hi Deok Lee, and Ga Won Lee*. "Body engineering structure for ZnO thin-film transistors: a Schottky-contact-merged ZnO TFT." Journal of Information Display 14.3 (2013): 89-91.
Seong-Hyeon Kim, Kwang-Seok Jeong, Ga-Won Lee, and Hi-Deok Lee*. "Effects of the Al2O3 interlayer in ZnO thin-film transistors fabricated via atomic layer deposition." Journal of Information Display 14.2 (2013): 61-65.
Yu-Mi Kim, Kwang-Seok Jeong, Ho-Jin Yun, Seung-Dong Yang, Sang-Youl Lee, Yeong-Cheol Kim, Jae-Kyeong Jeong, Hi-Deok Lee, and Ga-Won Lee*. "Investigation of zinc interstitial ions as the origin of anomalous stress-induced hump in amorphous indium gallium zinc oxide thin film transistors." Applied Physics Letters 102.17 (2013): 173502.
Ho-Jin Yun, Kyu-Ha Baek, Lee-Mi Do, Kwang-Seok Jeong, Yu-Mi Kim, Seung-Dong Yang, Sang-Youl Lee, Hi-Deok Lee, and Ga-Won Lee*. "Additive effect of poly (4-vinylphenol) gate dielectric in organic thin film transistor at low temperature process." Journal of nanoscience and nanotechnology 13.5 (2013): 3313-3316.
SD Yang, KS Jeong, HJ Yun, YM Kim, SY Lee, JS Oh, HD Lee, and GW Lee*. "Analysis of Flicker Noise for Improved Data Retention Characteristics in Silicon-Oxide-High-k-Oxide-Silicon Flash Memory Using N2 Implantation." Journal of Nanoscience and Nanotechnology 13.5 (2013): 3331-3334.
Jae-Sub Oh, Seong-Dong Yang, Sang-Youl Lee, Young-Su Kim, Min-Ho Kang, Sung-Kyu Lim, Hi-Deok Lee, and Ga-Won Lee*. "Tunneling oxide engineering by ion implantation of nitrogen for 3D vertical silicon pillar SONOS flash memory." Microelectronic engineering 103 (2013): 33-35.
Kwang-Seok Jeong, Ho-Jin Yun, Yu-Mi Kim, Seung-Dong Yang, Sang-Youl Lee, Young-Su Kim, Hi-Deok Lee, and Ga-Won Lee*. "Investigation of the gate bias stress instability in ZnO thin film transistors by low-frequency noise analysis." Japanese Journal of Applied Physics 52.4S (2013): 04CF04.
Sang Youl Lee, Jae Sub Oh, Seung Dong Yang, Ho Jin Yun, Kwang Seok Jeong, Yu Mi Kim, Hi Deok Lee, and Ga Won Lee*. "Polycrystalline Silocon-Oxide-Nitride-Oxide-Silicon Flash Memory on SiO2 and Si3N4 Buffer Layer for System on Panels Application." Advanced Materials Research. Vol. 658. Trans Tech Publications Ltd, 2013.
Seung Dong Yang, Ho Jin Yun, Kwang Seok Jeong, Yu Mi Kim, Sang Youl Lee, Jae Sub Oh, Hi Deok Lee, and Ga Won Lee*. "The analysis of 3-Level Charge Pumping in SOHOS Flash Memory." Advanced Materials Research. Vol. 658. Trans Tech Publications Ltd, 2013.
Kwang-Seok Jeong, Yu-Mi Kim, Ho-Jin Yun, Seung-Dong Yang, Sang-Youl Lee, Hi-Deok Lee, and Ga-Won Lee*. "Effect of Al2O3 Capping Layer in ZnO TFT Fabricated by Atomic Layer Deposition." Advanced Materials Research. Vol. 658. Trans Tech Publications Ltd, 2013.