Testing needs to be planned to be cost and time effective. Planning is setting out standards for tests. Test plans set out the context in which individual engineers can place their own work. Typical test plan contains:

Overview of testing process

>Requirements trace ability (to ensure that all requirements are tested)

>List of item to be tested

>Schedule

>Recording procedures so that test results can be audited

>Hardware and software requirement

OVERVIEW OF TESTING STRATEGIES:

Large system usually tested using a mixture of strategies. Different strategies may be needed for different parts of the system or at a stage of the process.

Top-down testing:

This approach tests high levels of system before detailed components. This is an appropriate when developing the system top-down likely to show up structural design errors early (and therefore cheaply) has advantage that a limited, working system available early on. Validation (as distinct from verification) can begin early. Its disadvantage is that stubs needs to be generated (extra effort) and might be impracticable if component is complex (e.g. converting an array into a linked list; unrealistic to generate random list; therefore end up implementing unit anyway). Test output may be difficult to observe (needs creation of artificial environment). This is not appropriate for OO systems (except within a class).

Bottom-up testing:

This is opposite of top-down testing. This testing test low-level unit then works up hierarchy. Its advantages and disadvantages of bottom-up mirror those of top-down. In this testing there is need to write test drivers for each unit. These are as reusable as the unit itself. Combining top-down development with bottom-up testing means that all parts of system must be implemented before testing can begin, therefore does not accord with incremental approach discussed above. Bottom-up testing less likely to reveal architectural faults early on. However, bottom-up testing of critical low-level components is almost always necessary. Appropriate for OO systems.

Stress testing:

Test system's ability to cope with a specified load (e.g. transactions per second). Plan tests to increase load incrementally. Go beyond design limit until system fails (this test particularly important for distributed systems (check degradation as network exchange data).

Back-to-back testing:

Comparison of test results from different versions of the system (e.g. compare with prototype, previous version or different configuration). Process - Run first system, saving test case results. Run second system, also saving its results. Compare results files. Note that no differences don’t imply no bugs. Both systems may have made the same mistake.

Defect testing: A successful defect test is a test that causes the system to behave incorrectly. Defect testing is not intended to show that a program meets its specification. If tests don't show up defects it may mean that the tests are not exhaustive enough.

Exhaustive testing is not always practicable. Subset has to be defined (this should be part of the test plan, not left to the individual programmer). Possible methods:

Test capabilities rather than components (e.g. concentrate on tests for data loss over ones for screen layout).

>Test old in preference to new (users less effected by failure of new capabilities).

>Test typical cases rather than boundary ones (ensure normal operation works properly).

Three approaches to defect testing. Each is most appropriate to different types of component. Studies show that black box testing is more effective in discovering faults than white-box testing. However, the rate of fault detection (faults detected per unit time) was similar for each approach. Also showed that static code reviewing was more effective and less expensive than defect testing.

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