Experience

Purdue University

Educational Institution; Higher Education industry

August 2006 – Present (4 years 9 months)

Significant Research Projects:

Optical Limiting Device (Army Research Laboratory Project in collaboration with University of Central Florida, Georgia Institute of Technology, and University of Arizona)

• Overview: Enhanced two photon absorption 1000 times through nanoantennas design.

• Fabricated nanoantennas array with small gap (<10mm) through E-beam lithography.

• Characterized nonlinear refractive index through z-scan nonlinear measurement.

• Led the joint Universities fabrication team and managed the ultrafast laser systems (fs/ps) to develop optical table experiences.

Improving Plasmonic Resonance (Multidisciplinary University Project)

• Overview: Characterized internal crystal structure of thin films and plasmonic nonoantennas to reduce the loss in the metamaterial through low temperature annealing.

• Trained peers to operate XRD equipments (PANalytical, Inc) for thin-film stress/grain-size characterization

Technical Communication Skills:

• Peer Reviewer, Optics Express and Optics Letters, 2009-2010.

• Published two journal papers, five conference papers, and presented at international conferences.

Army

Government Agency; 10,001+ employees; Military industry

October 2004 – January 2006 (1 year 4 months)

Special in radio and wire communication.

National Taiwan University

Educational Institution; Higher Education industry

July 2002 – June 2004 (2 years)

Overview: Involved in the national collaborative project, "Disease Diagnosis and Drug Screening with Multifunctional Opto-Electronic Biochip Systems."

• Improved the sensitivity of Surface Plasmon Biosensor by thin-film design.

• Developed three unique configurations of surface Plasmon optical sensors utilizing commercial and internally developed ellipsometers.

• Implemented an optical interference coating simulation tool using MATLAB.

Instrument Technology Research Center

Nonprofit; Government Relations industry

August 2003 – April 2004 (9 months)

Developed knowledge of optical thin film fabrication and processing; accomplished thin-film characterization through the ellipsometer measurement.