Career Highlights

Research  Scientist & Group Leader of SUSNAG*    (CMUXE**,  Purdue University, USA)     Feb. 2023 - present

Assistant Professor (Physics & Nanotech), SRM - IST,  Kattankulathur, Tamil Nadu, India   Dec. 2020 - Jan. 2023

Post Doctoral Research Associate & Group Leader of SUSNAG*    (CMUXE**,  Purdue University, USA)     May 2013 - April 2019 

 Post Doctoral Fellow                               (Mechanical Engineering, Tel Aviv University, Israel)         Jan. 2009 - March 2013

Post Doctoral Fellow                                                                              (Institute of Physics,  India)             Jan. 2007 – Dec. 2008

Visiting Scientist                                                             (Helmholtz-Zentrum Dresden-Rossendorf, Germany)                        June - Sept. 2008

Ph. D. (Physics)                                                           (Banaras Hindu University, India)                                2001 – 2006

*SUSNAG  >>>  SUrface Science and NAnostructure Group ;  ** CMUXE  >>>  Center for Materials Under eXtreme Environment

 Expertise

Surface Science  

Omicron variable-temperature (25-1500K) scanning probe microscope (SPM), including both scanning tunneling (STM) and  atomic force (AFM) microscopy options, capable of time-resolved monitoring of epitaxial growth from a computer-controlled, precise three-pocket e-beam evaporator.  This is a multinational in-situ surface characterization state-of-the-art facility integrated with low- (LEED) and reflection high- (RHEED) energy electron diffraction, Auger electron spectrometer (AES), Mass-spectrometer, Sputter-ion gun, and several other useful tools and techniques.    

scanning tunneling microscopy (STM) 

Atomic Force Microscopy (AFM)

Scanning Electron Microscopy (SEM)

low energy electron diffraction (LEED),

Reflection high energy electron diffraction (RHEED),

Field Emission SEM and EDX (Energy Dispersive X-ray )

Focused Ion Beam (FIB) 

X-ray Photoelectron Spectroscopy (XPS)

Ultraviolet Photoelectron Spectroscopy (UPS)

Auger Electron Spectroscopy (AES)

Ion scattering spectroscopy (ISS)

X Ray Reflectivity (XRR)

X-Ray Diffraction (XRD) 

Material Growth and Nanofabrication 

Multi-purpose Variable - Temperature UHV SPM (Omicron model AFM-25), which can be operated in STM and atomic force microscopy (AFM) modes, where metal evaporation, heat treatments, and subsequent analyses are carried-out. Here one can make the metal deposition from a three-pocket mini e-beam evaporator, capable of fully- or semi-automated operation and purpose-designed to incident upon the specimen mounted in the SPM stage. Usually we are monitoring the growth mechanism by acquiring SPM images in real-time, at desired temperatures and under exposure to the metal fluxes. Such a modus operandi allows direct insight into the kinetics of processes, such as nucleation and growth, phase transitions at the surface, and metal-semiconductor reactions, as they happen and with atomic resolution!

In-situ E-Beam Evaporation

Pulse Laser  Deposition (PLD)

RF Sputter Deposition

Ion Beam Assisted Deposition (IBAD)

Ion Beam Sputter Deposition (IBSD/IBD) 

Laser Beam Exfoliation  

Electrical Transport and Magnetoresistance Methods

Current-Voltage (I-V) (variable temperature) 

Capacitance-Voltage (C-V)

Giant magnetoresistance (GMR)

Magnetoresitence (MR)

Tunnel Magneto Resistance (TMR)

Magnetic Characterization

Magneto - Optic Kerr Effect (MOKE) 

Vibrating Sample Magnetometer (VSM) 

Superconducting Quantum Inferences Device (SQUID) Magnetometer 

Magnetic Force Microscopy (MFM) 

Ion Beam Irradiation Induced Materials Modifications

Dual Ion Beam Irradiation (DIBI)

Unique Ion Beam Irradiation Facility: In-situ Dual Ion (Helium and Deuterium) Beam Irradiation (DIBI) and simultaneous Transient Heat Loading (in Edge Localized Mode ( ELM)) >>> Nuclear Fusion like Environment at Laboratory Scale  

In-situ Ion Beam Irradiation, ISS, XPS, AES,and UPS

Thermal Desorption Spectroscopy (TDS) 

Ion irradiation using Swift Heavy ions (SHI)

Extensive working experience with 3 MV Tandem Pelletron Accelerators 

Rutherford Back-scattering Spectroscopy (RBS) 

Optical Property characterization

Optical Reflectivity

Raman and photoluminescence (PL)