Awards and Recognitions

Technical Skills:

Simulation and CAD tools: Synopsis SENTAURUS TCAD, Silvaco TCAD and EDA tools, MATLAB, LT Spice, Electric VLSI, Cadence Virtuoso. Agilent ICCAP and ADS, Silvaco UTMOST-III and UTMOST-IV

Experimental Skills:

Thin film deposition using sol gel process, Vacuum coating technique, Measurements using probe stations and device (pn junction, Schottky diodes, MOS capacitor, BJTs, FETs, MOSFETS, OPDs, OTFTs) characterization using HP semiconductor analyzer. Hall four probe measurement, LCR meter etc.

Clean room techniques: Photo-lithography; Resist Spinning and Developing; Etching (Wet and Dry)
Thin film. Deposition Equipment: Thermal Chemical Vapor Deposition System; Sputtering System, Ellipsometry.
Characterization Equipment: Scanning Electron Microscopy, Transmission Electron Microscopy, EDS, Atomic Force Microscopy and FTIR, Photoluminescence Spectroscopy, X-ray diffraction analysis (XRD), Electrochemical Characterization

Fellowships / Awards / Prizes / Certificates etc.:

•        According to AD Scientific-Listed in top 2% Scientist of the world-2023.

•        According to AD Scientific-Listed in top 2% Scientist of the world-2022.

•        Story about my paper published in current applied Physics in issue of May 2010, on organic photodetectors has been published by nature.com

•        Marquis Who's Who has selected my biography for inclusion in 2011-2012 (11th) Edition of Who's Who in Science and Engineering, the world renowned reference directory brought by the publisher of Who's Who in America.

•        Recipient of INSA Travel Fellowship (2008) for attending “International Workshop on Recent Advances of Low Dimensional Structures and devices (WRALDSD-2008)”, School of Physics and Astronomy, University of Nottingham, Nottingham U.K., April 7-9 April 2008.

•        Awarded UGC-SRF (2007), Department of Electronics Engineering, I. T. BHU, Varanasi-221005

•        Awarded UGC-JRF (2005), Department of Electronics Engineering, I. T. BHU, Varanasi-221005

•        Qualified Graduate Aptitude Test in Engineering (GATE) (2005)

•        Qualified Joint entrance screening test (JEST) (2004)

•        Qualified National Eligibility Test (NET)  (December-2003)