2006-2008

ORIGINAL PAPERS:

24) Y. Saito, M. Motohashi, N. Hayazawa*, M. Iyoki, and S. Kawata,

"Nanoscale characterization of strained silicon by tip-enhanced Raman spectroscope in reflection mode"

Applied Physics Letters, vol. 88, 143109 (2006).

(Selected for Virtual Journal of Nanoscale Science & Technology, vol. 13, Issue 15, (2006))

DOI: 10.1063/1.2191949

25) N. Hayazawa*, Y. Saito, M. Motohashi, M. Iyoki, and S. Kawata,

"Nanoscale characterization of localized strain in crystals by tip-enhanced Raman spectroscope in reflection-mode"

Proceedings of SPIE., vol. 6324, 63240L (2006).

DOI:10.1117/12.675808

26) Yuika Saito, Kazuhiko Yanagi, Norihiko Hayazawa, Hidekazu Ishitobi, Atsushi Ono, Hiromichi Kataura, and Satoshi Kawata,

" Vibrational Analysis of Organic Molecules Encapsulated in Carbon Nanotubes by Tip-enhanced Raman Spectroscopy "

Japanese Journal of Applied Physics, vol. 45, pp. 9286-9289 (2006).

DOI: 10.1143/JJAP.45.9286

27) N. Hayazawa*, H. Watanabe, Y. Saito, and S. Kawata,

"Towards atomic site selective sensitivity in tip-enhanced Raman spectroscopy"

The Journal of Chemical Physics, vol. 125, 244706 (2006).

(Selected for Virtual Journal of Nanoscale Science & Technology, vol. 15, Issue 2, (2007))

DOI: 10.1063/1.2423015

28) 早澤紀彦*、齊藤結花、河田聡、

 「ラジアル偏光ビームを用いた近接場ラマン顕微鏡」

光学 vol. 35, pp. 646-648 (2006) 解説記事 最近の技術から

29) N. Hayazawa*, M. Motohashi, Y. Saito, H. Ishitobi, A. Ono, T. Ichimura, P. Verma, and S. Kawata,

" Visualization of localized strain of a crystalline thin layer at the nanoscale by tip-enhanced Raman spectroscope and microscope "(Invited Article)

Journal of Raman Spectroscopy, vol. 38, pp. 684-696 (2007).

DOI: 10.1002/jrs.1728

30) K. Ikeda, Y. Saito, N. Hayazawa, S. Kawata, and K. Uosaki,

"Resonant hyper-Raman scattering from carbon nanotubes"

Chemical Physics Letters, vol. 438, pp. 109-112 (2007).

DOI: 10.1016/j.cplett.2007.02.050

31) Y. Saito, K. Yanagi, N. Hayazawa, H. Kataura, and S. Kawata,

Tip-enhanced near-field Raman spectroscopy applied to nano-composite materials

Proceedings of SPIE., vol. 6642, 66420E (2007).

DOI: 10.1117/12.733706

32) Y. Saito, M. Motohashi, N. Hayazawa*, and S. Kawata,

"Stress imaging of semiconductor surface by tip-enhanced Raman spectroscopy"

Journal of Microscopy, vol. 229, pp. 217-222 (2008).

DOI: 10.1111/j.1365-2818.2008.01889.x

33) N. Hayazawa*, M. Motohashi, Y. Saito, and S. Kawata,

" Characterization of localized strain of crystals in nano-scale by tip-enhanced Raman spectroscope and microscope "

Proceedings of SPIE., vol. 6769, 67690P (2007).

DOI:10.1117/12.733468

34) T. Yano, T. Ichimura, A. Taguchi, N. Hayazawa, P. Verma, Y. Inouye, and S. Kawata,

"Confinement of enhanced field investigated by tip-sample gap regulation in tapping-mode tip-enhanced Raman microscopy"

Applied Physics Letters, vol. 91, 121101 (2007).

DOI: 10.1063/1.2785115

35) N. Hayazawa*, H. Ishitobi, A. Taguchi, K. Ikeda, A. Tarun, and S. Kawata,

"Focused Excitation of Surface Plasmon Polaritons for Efficient Field Enhancement Based on Gap-Mode in Tip-Enhanced Spectroscopy"

Japanese Journal of Applied Physics, vol. 46, pp. 7995-7999 (2007).

DOI: 10.1143/JJAP.46.7995

36) A. Ono, K. Masui, Y. Saito, T. Sakata, A. Taguchi, M. Motohashi, T. Ichimura, H. Ishitobi, A. Tarun, N. Hayazawa, P. Verma, Y. Inouye, and S. Kawata,

"Active control of the oxidization of a silicon cantilever for the characterization of silicon-based semiconductors"

Chemistry Letters, vol. 37, pp. 122-123 (2008).

DOI: 10.1246/cl.2008.122

37) M. Motohashi, N. Hayazawa*, A. Tarun, and S. Kawata,

"Depolarization effect in reflection-mode TERS for Raman active crystals"

Journal of Applied Physics, 103, 034309 (2008).

DOI: 10.1063/1.2837837

38) A. Tarun, N. Hayazawa*, M. Motohashi, and S. Kawata,

"Highly efficient tip-enhanced Raman spectroscopy and microscopy of strained silicon in nanoscale"

Review of Scientific Instruments, vol. 79, 013706 (2008).

DOI: 10.1063/1.2832347

39) Alvarado Tarun, Masashi Motohashi, Norihiko Hayazawa, and Satoshi Kawata,

"Highly efficient heating assisted tip-enhanced Raman spectroscopy"

Proceedings of SPIE. Vol. 7033, 70330C (2008).

DOI:10.1117/12.793999